Modelling Surface State Trapping in Mosfet Devices

Research output: Chapter in Book/Report/Conference proceeding › Conference proceeding contribution › peer-review

Original language	English
Title of host publication	Proceedings of the 3rd international conference on electrical and computer engineering 2004
Editors	S Shahnawaz Ahmed
Place of Publication	Dhaka, Bangladesh
Publisher	ICECE
Pages	486-489
Number of pages	4
ISBN (Print)	9843218044
Publication status	Published - 2004
Event	3rd International Conference on Electrical and Computer Engineering - Dhaka, Bangladesh Duration: 28 Dec 2004 → 30 Dec 2004

Conference	3rd International Conference on Electrical and Computer Engineering
City	Dhaka, Bangladesh
Period	28/12/04 → 30/12/04

Cite this

@inproceedings{7e4afcf1b245469bbb29171b64f6b1cc,

title = "Modelling Surface State Trapping in Mosfet Devices",

author = "Saif Zaman and Parker, {Anthony Edward}",

year = "2004",

language = "English",

isbn = "9843218044",

pages = "486--489",

editor = "Ahmed, {S Shahnawaz}",

booktitle = "Proceedings of the 3rd international conference on electrical and computer engineering 2004",

publisher = "ICECE",

note = "3rd International Conference on Electrical and Computer Engineering ; Conference date: 28-12-2004 Through 30-12-2004",

}

TY - GEN

T1 - Modelling Surface State Trapping in Mosfet Devices

AU - Zaman, Saif

AU - Parker, Anthony Edward

PY - 2004

Y1 - 2004

M3 - Conference proceeding contribution

SN - 9843218044

SP - 486

EP - 489

BT - Proceedings of the 3rd international conference on electrical and computer engineering 2004

A2 - Ahmed, S Shahnawaz

PB - ICECE

CY - Dhaka, Bangladesh

T2 - 3rd International Conference on Electrical and Computer Engineering

Y2 - 28 December 2004 through 30 December 2004

ER -