Multi-grid SFX-MR approach for the analysis of large arrays

P. Pirinoli, Ladislau Matekovits, F. Vipiana, G. Vecchi, M. Orefice

Research output: Chapter in Book/Report/Conference proceedingConference proceeding contribution

2 Citations (Scopus)

Abstract

In this paper, a technique for the accurate analysis of large and/or complex arrays with limited numerical effort is presented. The method combines the Synthetic basis Function eXpansion (SFX) approach and the Multi-Resolution (MR) approach, both devoted to reducing the MoM-based analysis computational effort, but in different ways. The SFX generates few global basis functions on portions of the array, and uses them as basis functions in the whole structure analysis; the MR approach manages to generate "wavelet-like" hierarchical multiscale vector functions for any meshed geometry, and well controls the MoM condition number. Here the results of the combination of the two techniques will be presented: they will show that, taking advantages of the complementary properties of the two schemes, the computation cost needed for the analysis of large arrays is further reduced.

Original languageEnglish
Title of host publication2005 18th International Conference on Applied Electromagnetics and Communications
Place of PublicationPiscataway, NJ
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Pages1-4
Number of pages4
ISBN (Print)9536037440, 9789536037445
DOIs
Publication statusPublished - 2005
Event2005 18th International Conference on Applied Electromagnetics and Communications, ICECom 2005 - Dubrovnik, Croatia
Duration: 12 Oct 200514 Oct 2005

Other

Other2005 18th International Conference on Applied Electromagnetics and Communications, ICECom 2005
CountryCroatia
CityDubrovnik
Period12/10/0514/10/05

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  • Cite this

    Pirinoli, P., Matekovits, L., Vipiana, F., Vecchi, G., & Orefice, M. (2005). Multi-grid SFX-MR approach for the analysis of large arrays. In 2005 18th International Conference on Applied Electromagnetics and Communications (pp. 1-4). [1613528] Piscataway, NJ: Institute of Electrical and Electronics Engineers (IEEE). https://doi.org/10.1109/ICECOM.2005.205021