Multi-scale techniques for the pre-prototyping analysis of printed reflectarrays

P. Pirinoli*, L. Matekovits, V. A. Laza, F. Vipiana, G. Vecchi, M. Orefice

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference proceeding contribution

Abstract

In this paper, the application of multi-scales techniques to the analysis of reflectarrays (RA) is presented. They allow to obtain an accurate solution, necessary for the final phase of the design, with a reduced computation effort, that make the use of a full-wave approach allowable also in case of large structures, as are RAs.

Original languageEnglish
Title of host publicationICEAA 2005 - 9th International Conference on Electromagnetics in Advanced Applications and EESC 2005 - 11th European Electromagnetic Structures Conference
Place of PublicationPiscataway, NJ
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Pages1057-1060
Number of pages4
ISBN (Print)8882020932, 9788882020934
Publication statusPublished - 2005
Externally publishedYes
EventJoint 9th International Conference on Electromagnetics in Advanced Applications, ICEAA 2005 and 11th European Electromagnetic Structures Conference, EESC 2005 - Torino, Italy
Duration: 12 Sep 200516 Sep 2005

Other

OtherJoint 9th International Conference on Electromagnetics in Advanced Applications, ICEAA 2005 and 11th European Electromagnetic Structures Conference, EESC 2005
CountryItaly
CityTorino
Period12/09/0516/09/05

Cite this