Nanoparticle measurement in the optical far-field

D. J. Little, R. L. Kuruwita, A. Joyce, Q. Gao, T. Burgess, C. Jagadish, D. M. Kane

Research output: Chapter in Book/Report/Conference proceedingConference proceeding contribution

2 Citations (Scopus)

Abstract

Nanoparticles are rapidly becoming ubiquitous in modern technology and so there is an emerging need to characterise single nanoparticles rapidly and accurately. In the current technological paradigm, non-optical techniques such as electron microscopy (EM) and atomic-force microscopy (AFM) are favored for this role. Nano-characterization using optical microscopy though has several advantages; it can measure through transparent media, it is less likely to damage samples, it is rapid, convenient and is compatible with a host of advanced microscopy techniques. Here, we present a new nano-characterization technique called Visible Interferometric Electromagnetic Wave Scattering (VIEWS) [1], capable of leveraging the advantages of optical microscopy. VIEWS overcomes optical resolution limits by calculating nanoparticle characteristics directly from the optical phase measured using interferometric microscopy [2], rather than relying on image formation.

Original languageEnglish
Title of host publication2013 Conference on Lasers & Electro-Optics Europe & International Quantum Electronics Conference (CLEO EUROPE/IQEC 2013)
Place of PublicationPiscataway, NJ
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Pages1-1
Number of pages1
ISBN (Electronic)9781479905942, 9781479905935
ISBN (Print)9781479905928
DOIs
Publication statusPublished - 2013
Event2013 Conference on Lasers and Electro-Optics Europe and International Quantum Electronics Conference, CLEO/Europe-IQEC 2013 - Munich, Germany
Duration: 12 May 201316 May 2013

Other

Other2013 Conference on Lasers and Electro-Optics Europe and International Quantum Electronics Conference, CLEO/Europe-IQEC 2013
CountryGermany
CityMunich
Period12/05/1316/05/13

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