Near-field optical microscope for true surface topography: Theoretical study

A. Zvyagin*, M. Ohtsu

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

6 Citations (Scopus)

Abstract

We demonstrate an application of the perturbation theory based on the optical extinction theorem for the calculation of the near-field generated over a sample on a flat surface illuminated by a plane wave under total internal reflection angle. It is closely related to the theoretical modelling of a collection-mode near-field optical microscope (c-mode NOM). As an example, we calculated the near-field intensity over a semi-sphere on the flat surface. The main features of the calculated near-field are also discussed qualitatively in connection with a simple quasi-electrostatic model. On the basis of our analytical and numerical results we propose a c-mode NOM configuration which is advantageous for obtaining true surface topography.

Original languageEnglish
Pages (from-to)328-338
Number of pages11
JournalOptics Communications
Volume133
Issue number1-6
Publication statusPublished - 1 Jan 1997
Externally publishedYes

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