A technique for the determination of the S-parameters of a printed multi-port structure is presented. The first step is a least-squares extraction of the dominant TEM current on a microstrip line, and its separation into forward and reflected waves. This is then used to incorporate lumped, arbitrary-load conditions into the full-wave solution. By the application of this method at the different ports, the entries of the scattering matrix are obtained, with respect to matched-port conditions that are imposed numerically. Results are presented for a two-port structure.
|Title of host publication
|1998 IEEE Antennas and Propagation Society International Symposium (Held in conjunction with: USNC/URSI National Radio Science Meeting)
|Institute of Electrical and Electronics Engineers (IEEE)
|Number of pages
|Published - 1998