Abstract
A technique for the determination of the S-parameters of a printed multi-port structure is presented. The first step is a least-squares extraction of the dominant TEM current on a microstrip line, and its separation into forward and reflected waves. This is then used to incorporate lumped, arbitrary-load conditions into the full-wave solution. By the application of this method at the different ports, the entries of the scattering matrix are obtained, with respect to matched-port conditions that are imposed numerically. Results are presented for a two-port structure.
Original language | English |
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Title of host publication | 1998 IEEE Antennas and Propagation Society International Symposium (Held in conjunction with: USNC/URSI National Radio Science Meeting) |
Publisher | Institute of Electrical and Electronics Engineers (IEEE) |
Pages | 1838-1841 |
Number of pages | 4 |
Volume | 4 |
ISBN (Print) | 0780344782 |
DOIs | |
Publication status | Published - 1998 |
Externally published | Yes |