Never-ending struggles with mid-spatial frequencies

G. W. Forbes*

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference proceeding contributionpeer-review

31 Citations (Scopus)

Abstract

Optical surfaces feature a wide range of length scales from "figure" down to "finish", but the mid-spatial frequency structure (MSF) holds growing significance. Cost-effective production of systems demands answers to multiple layers of related questions, such as how best to quantify MSF, assess its optical impact, and employ existing production tools to meet MSF requirements. These answers evolve as new production technologies are introduced. I present general observations about a few of the associated challenges and attempt to clarify some essential aspects related to quantifying MSF as well as estimating its impact.

Original languageEnglish
Title of host publicationOptical Measurement Systems for Industrial Inspection IX
EditorsPeter Lehmann, Wolfgang Osten, Armando Albertazzi G. Jr.
Place of PublicationBellingham, WA
PublisherSPIE
Pages95251B-1-95251B-10
Number of pages10
ISBN (Electronic)9781628416855
DOIs
Publication statusPublished - 2015
Externally publishedYes
EventOptical Measurement Systems for Industrial Inspection IX - Munich, Germany
Duration: 22 Jun 201525 Jun 2015

Publication series

NameProceedings of SPIE
PublisherSPIE
Volume9525
ISSN (Print)0277-786X

Other

OtherOptical Measurement Systems for Industrial Inspection IX
CountryGermany
CityMunich
Period22/06/1525/06/15

Keywords

  • Mid-spatial frequency structure
  • optical surface specification
  • optical fabrication

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