Nondestructive measurement of complex permittivity of sheet material

A. K. Verma; Nasimuddin

doi:10.1002/mop.10797

Nondestructive measurement of complex permittivity of sheet material

A. K. Verma^*, Nasimuddin

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

2 Citations (Scopus)

Abstract

In this paper, we present a new model to determine the dielectric constant and the loss tangent of dielectric material in the sheet/slab form, with both low and high relative permittivity. A non-destructive testing method is used, based on the microstrip patch and line resonators. This method provides consistently accurate results, as compared to the nominal value of data given by the manufactures.

Original language	English
Pages (from-to)	483-486
Number of pages	4
Journal	Microwave and Optical Technology Letters
Volume	36
Issue number	6
DOIs	https://doi.org/10.1002/mop.10797
Publication status	Published - 20 Mar 2003
Externally published	Yes

Keywords

Dielectric constant
Loss-tangent
Microstrip patch
Sheet materials

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10.1002/mop.10797

Cite this

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title = "Nondestructive measurement of complex permittivity of sheet material",

abstract = "In this paper, we present a new model to determine the dielectric constant and the loss tangent of dielectric material in the sheet/slab form, with both low and high relative permittivity. A non-destructive testing method is used, based on the microstrip patch and line resonators. This method provides consistently accurate results, as compared to the nominal value of data given by the manufactures.",

keywords = "Dielectric constant, Loss-tangent, Microstrip patch, Sheet materials",

author = "Verma, {A. K.} and Nasimuddin",

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AU - Verma, A. K.

AU - Nasimuddin,

PY - 2003/3/20

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N2 - In this paper, we present a new model to determine the dielectric constant and the loss tangent of dielectric material in the sheet/slab form, with both low and high relative permittivity. A non-destructive testing method is used, based on the microstrip patch and line resonators. This method provides consistently accurate results, as compared to the nominal value of data given by the manufactures.

AB - In this paper, we present a new model to determine the dielectric constant and the loss tangent of dielectric material in the sheet/slab form, with both low and high relative permittivity. A non-destructive testing method is used, based on the microstrip patch and line resonators. This method provides consistently accurate results, as compared to the nominal value of data given by the manufactures.

KW - Dielectric constant

KW - Loss-tangent

KW - Microstrip patch

KW - Sheet materials

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U2 - 10.1002/mop.10797

DO - 10.1002/mop.10797

M3 - Article

AN - SCOPUS:0037456722

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SP - 483

EP - 486

JO - Microwave and Optical Technology Letters

JF - Microwave and Optical Technology Letters

IS - 6

ER -

Nondestructive measurement of complex permittivity of sheet material

Abstract

Keywords

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