Skip to main navigation Skip to search Skip to main content

Novel technique for determining bias, temperature and frequency dependence of FET characteristics

Anthony E. Parker*, James G. Rathmell

*Corresponding author for this work

    Research output: Contribution to journal › Article › peer-review

    4   Link opens in a new tab Citations (Scopus)

    Fingerprint

    Dive into the research topics of 'Novel technique for determining bias, temperature and frequency dependence of FET characteristics'. Together they form a unique fingerprint.
    Sort by

    Engineering

    Material Science

    Biochemistry, Genetics and Molecular Biology

    Neuroscience