Observation of cyclotron resonance halfwidth in pure n-CdTe

K. Pastor*, E. Gołdys

*Corresponding author for this work

Research output: Contribution to journalArticle

5 Citations (Scopus)

Abstract

"Persistent" cyclotron resonance of electrons in pure n type CdTe has been used to measure the halfwidth of the resonance as a function of the concentration of electrons. Although considerable improvement of appropriate theories has recently been made, the agreement is not as good as in some other experiments.

Original languageEnglish
Pages (from-to)671-674
Number of pages4
JournalSolid State Communications
Volume55
Issue number8
DOIs
Publication statusPublished - 1985
Externally publishedYes

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