Optical grain size measurements

What is being measured? Comparative study of optical and EBSD grain sizes determination in 2D Al foil

S. Piazolo*, V. G. Sursaeva, D. J. Prior

*Corresponding author for this work

    Research output: Chapter in Book/Report/Conference proceedingConference proceeding contribution

    9 Citations (Scopus)

    Abstract

    Reflected light optical analysis and Electron Backscatter Diffraction (EBSD) analysis have been used to m easure grain sizes in 2D Al foil samples, annealed for different times. There are significant differences in the results of the two techniques. It is shown that in Al it is possible to detect boundaries in optical images down to a misorientation angle of 7-8°. Nevertheless, in most samples the critical angle of easy etching lies above 10°. The observed differences in grain size measurements between optical analysis and EBSD analysis can be largely attributed to three phenomena: (1) individual samples may behave slighty differently due to differences in the effectiveness of etching (2) the grain size is heterogeneous over large areas and (3) the effect of etching is not only a function of misorientation angle but also grain boundary plane. Despite these uncertainties, optical analysis seems to be reliable for analysis of processes in which mainly grain boundaries with misorientation angle of > 10° are involved i.e. grain growth.

    Original languageEnglish
    Title of host publicationTextures of Materials, ICOTOM 14 - Proceedings of the 14th International Conference on Textures of Materials
    EditorsPaul Van Houtte, Leo Kestens
    Place of PublicationUetikon-Zurich, Switzerland; Enfield, NH
    PublisherTrans Tech Publications
    Pages213-218
    Number of pages6
    Volume495-497
    EditionPART 1
    ISBN (Print)087849975X, 9780878499755
    Publication statusPublished - 2005
    Event14th International Conference on Textures of Materials, ICOTOM 14 - Leuven, Belgium
    Duration: 11 Jul 200515 Jul 2005

    Publication series

    NameMaterials Science Forum
    NumberPART 1
    Volume495-497
    ISSN (Print)02555476

    Other

    Other14th International Conference on Textures of Materials, ICOTOM 14
    CountryBelgium
    CityLeuven
    Period11/07/0515/07/05

    Keywords

    • Al foil
    • EBSD analysis
    • Grain size
    • Optical analysis
    • Statistics

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