Optical surface profilometry and AFM of Orb weaver spider silks

D. M. Kane*, G. R. Staib, N. Naidoo, A. M. Joyce, J. R. Rabeau, M. E. Herberstein

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference proceeding contribution

3 Citations (Scopus)

Abstract

AFM (Atomic Force Microscopy) and OSP (Optical Surface Profiling) have been applied to measure the surfaces of spider silks both radials and capture silks-at the nano-and micro-scale.

Original languageEnglish
Title of host publicationICONN 2010 - Proceedings of the 2010 International Conference on Nanoscience and Nanotechnology
EditorsAndrew Dzurak
Place of PublicationPiscataway, NJ
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Pages222-224
Number of pages3
ISBN (Print)9781424452620
DOIs
Publication statusPublished - 2010
Event2010 3rd International Conference on Nanoscience and Nanotechnology, ICONN - 2010 - Sydney, Australia
Duration: 22 Feb 201026 Feb 2010

Other

Other2010 3rd International Conference on Nanoscience and Nanotechnology, ICONN - 2010
CountryAustralia
CitySydney
Period22/02/1026/02/10

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