Abstract
AFM (Atomic Force Microscopy) and OSP (Optical Surface Profiling) have been applied to measure the surfaces of spider silks both radials and capture silks-at the nano-and micro-scale.
Original language | English |
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Title of host publication | ICONN 2010 - Proceedings of the 2010 International Conference on Nanoscience and Nanotechnology |
Editors | Andrew Dzurak |
Place of Publication | Piscataway, NJ |
Publisher | Institute of Electrical and Electronics Engineers (IEEE) |
Pages | 222-224 |
Number of pages | 3 |
ISBN (Print) | 9781424452620 |
DOIs | |
Publication status | Published - 2010 |
Event | 2010 3rd International Conference on Nanoscience and Nanotechnology, ICONN - 2010 - Sydney, Australia Duration: 22 Feb 2010 → 26 Feb 2010 |
Other
Other | 2010 3rd International Conference on Nanoscience and Nanotechnology, ICONN - 2010 |
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Country/Territory | Australia |
City | Sydney |
Period | 22/02/10 → 26/02/10 |