Optical surface profilometry and AFM of Orb weaver spider silks

D. M. Kane; G. R. Staib; N. Naidoo; A. M. Joyce; J. R. Rabeau; M. E. Herberstein

doi:10.1109/ICONN.2010.6045264

Optical surface profilometry and AFM of Orb weaver spider silks

D. M. Kane^*, G. R. Staib, N. Naidoo, A. M. Joyce, J. R. Rabeau, M. E. Herberstein

^*Corresponding author for this work

MQ Photonics Research Centre

Research output: Chapter in Book/Report/Conference proceeding › Conference proceeding contribution › peer-review

3 Citations (Scopus)

Abstract

AFM (Atomic Force Microscopy) and OSP (Optical Surface Profiling) have been applied to measure the surfaces of spider silks both radials and capture silks-at the nano-and micro-scale.

Original language	English
Title of host publication	ICONN 2010 - Proceedings of the 2010 International Conference on Nanoscience and Nanotechnology
Editors	Andrew Dzurak
Place of Publication	Piscataway, NJ
Publisher	Institute of Electrical and Electronics Engineers (IEEE)
Pages	222-224
Number of pages	3
ISBN (Print)	9781424452620
DOIs	https://doi.org/10.1109/ICONN.2010.6045264
Publication status	Published - 2010
Event	2010 3rd International Conference on Nanoscience and Nanotechnology, ICONN - 2010 - Sydney, Australia Duration: 22 Feb 2010 → 26 Feb 2010

Other

Other	2010 3rd International Conference on Nanoscience and Nanotechnology, ICONN - 2010
Country/Territory	Australia
City	Sydney
Period	22/02/10 → 26/02/10

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10.1109/ICONN.2010.6045264

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Kane, D. M., Staib, G. R., Naidoo, N., Joyce, A. M., Rabeau, J. R., & Herberstein, M. E. (2010). Optical surface profilometry and AFM of Orb weaver spider silks. In A. Dzurak (Ed.), ICONN 2010 - Proceedings of the 2010 International Conference on Nanoscience and Nanotechnology (pp. 222-224). Article 6045264 Institute of Electrical and Electronics Engineers (IEEE). https://doi.org/10.1109/ICONN.2010.6045264

@inproceedings{0b18c6f909e84d76b41194010839a6ba,

title = "Optical surface profilometry and AFM of Orb weaver spider silks",

abstract = "AFM (Atomic Force Microscopy) and OSP (Optical Surface Profiling) have been applied to measure the surfaces of spider silks both radials and capture silks-at the nano-and micro-scale.",

author = "Kane, \{D. M.\} and Staib, \{G. R.\} and N. Naidoo and Joyce, \{A. M.\} and Rabeau, \{J. R.\} and Herberstein, \{M. E.\}",

year = "2010",

doi = "10.1109/ICONN.2010.6045264",

language = "English",

isbn = "9781424452620",

pages = "222--224",

editor = "Andrew Dzurak",

booktitle = "ICONN 2010 - Proceedings of the 2010 International Conference on Nanoscience and Nanotechnology",

publisher = "Institute of Electrical and Electronics Engineers (IEEE)",

address = "United States",

note = "2010 3rd International Conference on Nanoscience and Nanotechnology, ICONN - 2010 ; Conference date: 22-02-2010 Through 26-02-2010",

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Kane, DM, Staib, GR, Naidoo, N, Joyce, AM, Rabeau, JR & Herberstein, ME 2010, Optical surface profilometry and AFM of Orb weaver spider silks. in A Dzurak (ed.), ICONN 2010 - Proceedings of the 2010 International Conference on Nanoscience and Nanotechnology., 6045264, Institute of Electrical and Electronics Engineers (IEEE), Piscataway, NJ, pp. 222-224, 2010 3rd International Conference on Nanoscience and Nanotechnology, ICONN - 2010, Sydney, New South Wales, Australia, 22/02/10. https://doi.org/10.1109/ICONN.2010.6045264

Optical surface profilometry and AFM of Orb weaver spider silks. / Kane, D. M.; Staib, G. R.; Naidoo, N. et al.
ICONN 2010 - Proceedings of the 2010 International Conference on Nanoscience and Nanotechnology. ed. / Andrew Dzurak. Piscataway, NJ: Institute of Electrical and Electronics Engineers (IEEE), 2010. p. 222-224 6045264.

Research output: Chapter in Book/Report/Conference proceeding › Conference proceeding contribution › peer-review

TY - GEN

T1 - Optical surface profilometry and AFM of Orb weaver spider silks

AU - Kane, D. M.

AU - Staib, G. R.

AU - Naidoo, N.

AU - Joyce, A. M.

AU - Rabeau, J. R.

AU - Herberstein, M. E.

PY - 2010

Y1 - 2010

N2 - AFM (Atomic Force Microscopy) and OSP (Optical Surface Profiling) have been applied to measure the surfaces of spider silks both radials and capture silks-at the nano-and micro-scale.

AB - AFM (Atomic Force Microscopy) and OSP (Optical Surface Profiling) have been applied to measure the surfaces of spider silks both radials and capture silks-at the nano-and micro-scale.

UR - https://www.scopus.com/pages/publications/80555124975

U2 - 10.1109/ICONN.2010.6045264

DO - 10.1109/ICONN.2010.6045264

M3 - Conference proceeding contribution

AN - SCOPUS:80555124975

SN - 9781424452620

SP - 222

EP - 224

BT - ICONN 2010 - Proceedings of the 2010 International Conference on Nanoscience and Nanotechnology

A2 - Dzurak, Andrew

PB - Institute of Electrical and Electronics Engineers (IEEE)

CY - Piscataway, NJ

T2 - 2010 3rd International Conference on Nanoscience and Nanotechnology, ICONN - 2010

Y2 - 22 February 2010 through 26 February 2010

ER -

Kane DM, Staib GR, Naidoo N, Joyce AM, Rabeau JR, Herberstein ME. Optical surface profilometry and AFM of Orb weaver spider silks. In Dzurak A, editor, ICONN 2010 - Proceedings of the 2010 International Conference on Nanoscience and Nanotechnology. Piscataway, NJ: Institute of Electrical and Electronics Engineers (IEEE). 2010. p. 222-224. 6045264 doi: 10.1109/ICONN.2010.6045264

Optical surface profilometry and AFM of Orb weaver spider silks

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