Abstract
Technique for optimisation of electromagnetic component and sub-system designs based on a cross-entropy method (CEM); with applications in electromagnetic fields such as antenna design; includes evaluating a formulated fitness function for each design in an i-th candidate group of designs sampled from a distribution-of-designs; each design includes multiple design variables characterised by respective i-th probability-distributions represented by an i-th set of distributional -parameters; the formulated fitness function being evaluated based on electromagnetic performance criteria of the corresponding design in the i-th candidate group of designs; and determining an (i+1)-th set of distributional-parameters (representing (i+1)-th probability-distributions characterising the respective multiple design variables) being determined based on a reduction of cross-entropy between an empirical-distribution characterising a selected i-th elite group of designs from the i-th candidate group of designs based on the evaluated fitness function and the (i+1)-th probability-distributions. Each design may include multiple design variables including a discrete and a continuous variable.
Original language | English |
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Patent number | WO2018032052 |
IPC | G06F 17/50 2006.01,G06F 17/10 2006.01,H04B 7/00 2006.01,H01Q 15/00 2006.01,G01S 17/00 2006.01 |
Priority date | 16/08/16 |
Publication status | Submitted - 22 Feb 2018 |
Bibliographical note
Designated StatesAE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, JP, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)