Oscillation-based DFT for second-order OTA-C filters

Masood-Ul-Hasan, Yichuang Sun, Xi Zhu, James Moritz

Research output: Chapter in Book/Report/Conference proceedingConference proceeding contributionpeer-review

11 Citations (Scopus)


We propose an easily implemented and low-cost design-for-testability scheme for OTA-C filters based on an oscillation-based test (OBT) methodology. The OBT method is a vectorless output test strategy easily applicable to built-in self-test. During test mode, the filter under test is converted into an oscillator by establishing the oscillation condition in its transfer function. The oscillator frequency can be measured using digital circuitry and deviations from the cut-off frequency indicate faulty behaviour of the filter. The proposed method is suitable for both catastrophic and parametric fault diagnosis and is effective in detecting single and multiple faults. The validity of the proposed method has been verified using comparison between faulty and fault-free simulation results of two-integrator loop, Tow-Thomas and KHN OTA-C filters. Simulation results for 2nd order filters using a 0.25μm CMOS technology show that the proposed oscillation-based test strategy has more than 96% fault coverage and, with a minimum number of extra components, requires a negligible area overhead.

Original languageEnglish
Title of host publication2008 IEEE International Symposium on Circuits and Systems, ISCAS 2008
Place of PublicationPiscataway, NJ
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Number of pages4
ISBN (Print)9781424416844
Publication statusPublished - 2008
Externally publishedYes
Event2008 IEEE International Symposium on Circuits and Systems, ISCAS 2008 - Seattle, WA, United States
Duration: 18 May 200821 May 2008


Other2008 IEEE International Symposium on Circuits and Systems, ISCAS 2008
Country/TerritoryUnited States
CitySeattle, WA


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