Performance evaluation of a new novel planar interdigital sensors

A. R Mohd Syaifudin, P. L. Yu, S. C. Mukhopadhyay, Michael J. Haji-Sheikh, J. Vanderford

Research output: Chapter in Book/Report/Conference proceedingConference proceeding contribution

3 Citations (Scopus)

Abstract

A new novel planar interdigital sensor has been fabricated to have better sensing performance. The new sensors were fabricated using latest technology in sensor fabrication. The new sensors have four different layers which consist of conductor 1 for main trace and interdigitated capacitor trace, conductor 2 for thicker pads for series mount of resistor and other connections, dielectric dams for the surface mount resistor and a ground plane. Result from the experiments have shown that new novel sensor have better stability in term of amplitude and phase angle, very small resistive part and better shielding to reduce noise. It is also shown that new sensor has stable sensitivity measurement at different temperature.

Original languageEnglish
Title of host publication2010 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2010 - Proceedings
Place of PublicationPiscataway, NJ
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Pages731-736
Number of pages6
ISBN (Print)9781424428335
DOIs
Publication statusPublished - 2010
Externally publishedYes
Event2010 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2010 - Austin, TX, United States
Duration: 3 May 20106 May 2010

Other

Other2010 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2010
CountryUnited States
CityAustin, TX
Period3/05/106/05/10

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Syaifudin, A. R. M., Yu, P. L., Mukhopadhyay, S. C., Haji-Sheikh, M. J., & Vanderford, J. (2010). Performance evaluation of a new novel planar interdigital sensors. In 2010 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2010 - Proceedings (pp. 731-736). [5488245] Piscataway, NJ: Institute of Electrical and Electronics Engineers (IEEE). https://doi.org/10.1109/IMTC.2010.5488245