Permutation entropy analysis as a tool to characterize pulsed lasing regions

J. P. Toomey; D. M. Kane; T. Ackemann

doi:10.1109/ISLC.2014.197

Permutation entropy analysis as a tool to characterize pulsed lasing regions

J. P. Toomey, D. M. Kane, T. Ackemann

MQ Photonics Research Centre

Research output: Chapter in Book/Report/Conference proceeding › Conference proceeding contribution

Abstract

Permutation entropy is evaluated as a quality measure for sequences of pulses from several laser systems. Assessing the complexity on different timescales can indicate when the dynamics changes from irregular to fairly regular pulsed states.

Original language	English
Title of host publication	Conference Digest - IEEE International Semiconductor Laser Conference
Place of Publication	Piscataway, NJ
Publisher	Institute of Electrical and Electronics Engineers (IEEE)
Pages	129-130
Number of pages	2
ISBN (Electronic)	9781479957217
DOIs	https://doi.org/10.1109/ISLC.2014.197
Publication status	Published - 16 Dec 2014
Event	2014 24th IEEE International Semiconductor Laser Conference, ISLC 2014 - Palma de Mallorca, Spain Duration: 7 Sept 2014 → 10 Sept 2014

Other

Other	2014 24th IEEE International Semiconductor Laser Conference, ISLC 2014
Country/Territory	Spain
City	Palma de Mallorca
Period	7/09/14 → 10/09/14

Access to Document

10.1109/ISLC.2014.197

Cite this

@inproceedings{a8fc7f7073094836ba98388438e36faf,

title = "Permutation entropy analysis as a tool to characterize pulsed lasing regions",

abstract = "Permutation entropy is evaluated as a quality measure for sequences of pulses from several laser systems. Assessing the complexity on different timescales can indicate when the dynamics changes from irregular to fairly regular pulsed states.",

author = "Toomey, {J. P.} and Kane, {D. M.} and T. Ackemann",

year = "2014",

month = dec,

day = "16",

doi = "10.1109/ISLC.2014.197",

language = "English",

pages = "129--130",

booktitle = "Conference Digest - IEEE International Semiconductor Laser Conference",

publisher = "Institute of Electrical and Electronics Engineers (IEEE)",

address = "United States",

note = "2014 24th IEEE International Semiconductor Laser Conference, ISLC 2014 ; Conference date: 07-09-2014 Through 10-09-2014",

}

Toomey, JP, Kane, DM & Ackemann, T 2014, Permutation entropy analysis as a tool to characterize pulsed lasing regions. in Conference Digest - IEEE International Semiconductor Laser Conference., 6987484, Institute of Electrical and Electronics Engineers (IEEE), Piscataway, NJ, pp. 129-130, 2014 24th IEEE International Semiconductor Laser Conference, ISLC 2014, Palma de Mallorca, Spain, 7/09/14. https://doi.org/10.1109/ISLC.2014.197

Permutation entropy analysis as a tool to characterize pulsed lasing regions. / Toomey, J. P.; Kane, D. M.; Ackemann, T.
Conference Digest - IEEE International Semiconductor Laser Conference. Piscataway, NJ: Institute of Electrical and Electronics Engineers (IEEE), 2014. p. 129-130 6987484.

Research output: Chapter in Book/Report/Conference proceeding › Conference proceeding contribution

TY - GEN

T1 - Permutation entropy analysis as a tool to characterize pulsed lasing regions

AU - Toomey, J. P.

AU - Kane, D. M.

AU - Ackemann, T.

PY - 2014/12/16

Y1 - 2014/12/16

N2 - Permutation entropy is evaluated as a quality measure for sequences of pulses from several laser systems. Assessing the complexity on different timescales can indicate when the dynamics changes from irregular to fairly regular pulsed states.

AB - Permutation entropy is evaluated as a quality measure for sequences of pulses from several laser systems. Assessing the complexity on different timescales can indicate when the dynamics changes from irregular to fairly regular pulsed states.

UR - http://www.scopus.com/inward/record.url?scp=84920114803&partnerID=8YFLogxK

U2 - 10.1109/ISLC.2014.197

DO - 10.1109/ISLC.2014.197

M3 - Conference proceeding contribution

AN - SCOPUS:84920114803

SP - 129

EP - 130

BT - Conference Digest - IEEE International Semiconductor Laser Conference

PB - Institute of Electrical and Electronics Engineers (IEEE)

CY - Piscataway, NJ

T2 - 2014 24th IEEE International Semiconductor Laser Conference, ISLC 2014

Y2 - 7 September 2014 through 10 September 2014

ER -

Permutation entropy analysis as a tool to characterize pulsed lasing regions

Abstract

Other

Access to Document

Other files and links

Fingerprint

Cite this