Phase-stepping interferometry of GaAs nanowires: Determining nano-wire radius

D. J. Little*, R. L. Kuruwita, A. Joyce, Q. Gao, T. Burgess, C. Jagadish, D. M. Kane

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

6 Citations (Scopus)
14 Downloads (Pure)

Abstract

Phase stepping interferometry is used to measure the size of near-cylindrical nanowires. Nanowires with nominal radii of 25 nm and 50 nm were used to test this by comparing specific measured optical phase profile values with theoretical values calculated using a wave-optic model of the Phase stepping interferometry (PSI) system. Agreement within 10% was found, which enabled nanowire radii to be predicted within 4% of the nominal value. This demonstration highlights the potential capability for phase stepping interferometry to characterize single nanoparticles of known geometry in the optical far-field.

Original languageEnglish
Article number161107
Pages (from-to)1-4
Number of pages4
JournalApplied Physics Letters
Volume103
Issue number16
DOIs
Publication statusPublished - 14 Oct 2013

Bibliographical note

Copyright 2013 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Applied physics letters, 103, 161107 (2013) and may be found at http://scitation.aip.org/content/aip/journal/apl/103/16/10.1063/1.4825153

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