Photoacoustic spectroscopy of CuInSe2 thin films

A. Zegadi*, D. M. Bagnall, A. Belattar, R. D. Pilkington, M. A. Slifkin, A. E. Hill, R. D. Tomlinson

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

24 Citations (Scopus)

Abstract

Polycrystalline CuInSe2 thin films grown by the three-source co-evaporation technique are assessed near their fundamental absorption edge with a high resolution photoacoustic spectrometer of the gas-microphone type. The results are presented for films differing in uniformity, composition and thickness. The effect of heat treatment in various ambients on the properties of these films have also been investigated using in addition to photoacoustic spectroscopy, X-ray diffraction, Rutherford backscattering spectroscopy and scanning electron microscopy.

Original languageEnglish
Pages (from-to)248-253
Number of pages6
JournalThin Solid Films
Volume226
Issue number2
DOIs
Publication statusPublished - 30 Apr 1993
Externally publishedYes

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