Photoinduced microwave reflectometry as a non-invasive technique for S.I. InP wafer characterization

Ronald J. Gutmann*, Michael C. Heimlich, Margaret Tait, Richard B. Bylsma, Eric M. Monberg

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference proceeding contribution

2 Citations (Scopus)

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Engineering & Materials Science