Photon-counting Raman spectroscopy of silicon nanowires

M. J. Collins, C. Grillet, S. Shahnia, A. S. Clark, P. Grosse, B. Ben Bakir, S. Menezo, J. M. Fedeli, C. Xiong, D. J. Moss, B. J. Eggleton, C. Monat

Research output: Chapter in Book/Report/Conference proceedingConference proceeding contribution

Abstract

Raman scattering can be exploited for amplification in optical fiber telecommunications or, chemical identification in spectroscopy, but represents a source of detrimental noise photons for quantum communications. The spectral distribution of spontaneous Raman scattering (SpRS) can be measured in bulk samples with the free-space 90° scattering method [1]. In long fibers the SpRS spectra can be measured using a pulsed laser to achieve measurable signals [2], incompatible with the damage threshold of many on-chip devices. Measurements of stimulated Raman scattering have been performed using nonlinear pump-probe techniques [3], requiring the addition of either a highly tunable or ultra-broad bandwidth probe. Recently photon-counting techniques have been demonstrated to measure weak SpRS signals in fibers [4-6], however no direct measurements of the SpRS spectra of nanophotonic chip-devices over a broad bandwidth have been performed.

Original languageEnglish
Title of host publication2013 Conference on Lasers & Electro-Optics Europe & International Quantum Electronics Conference (CLEO EUROPE/IQEC 2013)
Place of PublicationPiscataway, NJ
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Number of pages1
ISBN (Electronic)9781479905942
ISBN (Print)9781479905928
DOIs
Publication statusPublished - 2013
Externally publishedYes
Event2013 Conference on Lasers and Electro-Optics Europe and International Quantum Electronics Conference, CLEO/Europe-IQEC 2013 - Munich, Germany
Duration: 12 May 201316 May 2013

Other

Other2013 Conference on Lasers and Electro-Optics Europe and International Quantum Electronics Conference, CLEO/Europe-IQEC 2013
CountryGermany
CityMunich
Period12/05/1316/05/13

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