Abstract
In this paper, we present a physics based compact model for GaN-based Metal-Semiconductor-Metal (MSM) 2DEG varactors in which the intrinsic charges and currents are evaluated in terms of the bias-dependent surface-potential. Physical phenomena such as Thermionic Emission, Poole-Frenkel Effect and Fowler-Nordheim Tunneling are incorporated to realize the non-idealities of the Schottky gates. The model is successfully validated against measured data for a state-of-the-art GaN-based varactor. Furthermore, a circuit simulation is performed for a phase shifting network wherein its behavior for various bias conditions and operating frequencies is observed using the proposed model.
| Original language | English |
|---|---|
| Title of host publication | 2018 IEEE Electron Devices Technology and Manufacturing Conference (EDTM) |
| Subtitle of host publication | proceedings of technical papers |
| Place of Publication | Piscataway, NJ |
| Publisher | Institute of Electrical and Electronics Engineers (IEEE) |
| Pages | 349-351 |
| Number of pages | 3 |
| ISBN (Electronic) | 9781538637128, 9781538637111 |
| ISBN (Print) | 9781538637135 |
| DOIs | |
| Publication status | Published - 2018 |
| Event | 2nd IEEE Electron Devices Technology and Manufacturing Conference, EDTM 2018 - Kobe, Japan Duration: 13 Mar 2018 → 16 Mar 2018 |
Conference
| Conference | 2nd IEEE Electron Devices Technology and Manufacturing Conference, EDTM 2018 |
|---|---|
| Country/Territory | Japan |
| City | Kobe |
| Period | 13/03/18 → 16/03/18 |
Keywords
- MSM-2DEG
- Varactor
- Compact Model
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