### Abstract

Diffraction of E-polarized plane wave obliquely incident on rectangular cavity with attached finite flanges is rigorously solved. Ill-conditioned surface integral equation of the first kind is transformed to the well-conditioned matrix equation of the second kind with compact in l

_{2}operator. The matrix equation is numerically solved by truncation method. Fast convergence of truncated algebraic systems makes it possible to find solution with any predetermined accuracy. The solution is free from limitations on parameters of the problem. Numerical calculations have been done to analyze the cavity reflectivity. Monostatic and bi-static RCS are computed for various flanged cavity parameters. The special attention paid to the impact of the size of the flanges on surface current density distribution inside a cavity.Original language | English |
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Title of host publication | Proceedings of the 2017 19th International Conference on Electromagnetics in Advanced Applications, ICEAA 2017 |

Place of Publication | Piscataway, NJ, USA |

Publisher | Institute of Electrical and Electronics Engineers (IEEE) |

Pages | 937-939 |

Number of pages | 3 |

Edition | 19th |

ISBN (Electronic) | 9781509044511 |

ISBN (Print) | 9781509044528 |

DOIs | |

Publication status | Published - 12 Oct 2017 |

Event | 19th International Conference on Electromagnetics in Advanced Applications, ICEAA 2017 - Verona, Italy Duration: 11 Sep 2017 → 15 Sep 2017 |

### Conference

Conference | 19th International Conference on Electromagnetics in Advanced Applications, ICEAA 2017 |
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Country | Italy |

City | Verona |

Period | 11/09/17 → 15/09/17 |

### Keywords

- Cavity resonators
- Flanges
- Electromagnetic scattering
- Mathematical model
- Current density
- Diffraction

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## Cite this

Vinogradova, E. (2017). Plane wave diffraction by 2D rectangular cavity with flanges. In

*Proceedings of the 2017 19th International Conference on Electromagnetics in Advanced Applications, ICEAA 2017*(19th ed., pp. 937-939). [8065410] Piscataway, NJ, USA: Institute of Electrical and Electronics Engineers (IEEE). https://doi.org/10.1109/ICEAA.2017.8065410