Process-dependence of the even-order nonlinearity in anti-parallel diode pair mixers

Venkata Gutta*, Anthony E. Parker, Anthony Fattorini

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

2 Citations (Scopus)
7 Downloads (Pure)

Abstract

Diode mismatch in an anti-parallel diode mixer can generate a product at the second-harmonic of the local oscillator frequency. This product is referred to as the virtual local oscillator leakage. Variability in the fabrication process results in diode mismatch and is noticeable as an asymmetry in the current-voltage characteristics. Its impact on the virtual local oscillator leakage is analyzed by studying two populations of circuits with different diode sizes, fabricated using a six inch Gallium Arsenide heterojunction bipolar transistor process. Each population contained thirty circuits, within the same quarter-wafer.

Original languageEnglish
Article number4752861
Pages (from-to)86-88
Number of pages3
JournalIEEE Microwave and Wireless Components Letters
Volume19
Issue number2
DOIs
Publication statusPublished - Feb 2009

Bibliographical note

Copyright 2009 IEEE. Reprinted from IEEE microwave and wireless components letters, volume 19, issue 2, 86-88. This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of Macquarie University’s products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to pubs-permissions@ieee.org. By choosing to view this document, you agree to all provisions of the copyright laws protecting it.

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