Propagation characteristics of Schottky-contact slow-wave microstrip line

A. K. Verma*, Nasimuddin

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

1 Citation (Scopus)


The present paper computes the normalized phase constant, dielectric loss, and conductor loss of the voltage-controlled Schottky-contact microstrip line using the variational method based on the single-layer reduction (SLR) formulation. Results computed by the SLR formulation show very good agreement with the experimental results, both in the normalized phase constant and total losses with 2.0% and 0.01 dB/mm, respectively. The present formulation can also handle a greater number of dielectric layers. The model is suitable for the CAD of Schottky-contact microstrip structures.

Original languageEnglish
Pages (from-to)341-344
Number of pages4
JournalMicrowave and Optical Technology Letters
Issue number5
Publication statusPublished - 5 Jun 2001
Externally publishedYes


  • CAD
  • Microstrip
  • MICs
  • Schottky contact


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