Propagation characteristics of Schottky-contact slow-wave microstrip line

The present paper computes the normalized phase constant, dielectric loss, and conductor loss of the voltage-controlled Schottky-contact microstrip line using the variational method based on the single-layer reduction (SLR) formulation. Results computed by the SLR formulation show very good agreement with the experimental results, both in the normalized phase constant and total losses with 2.0% and 0.01 dB/mm, respectively. The present formulation can also handle a greater number of dielectric layers. The model is suitable for the CAD of Schottky-contact microstrip structures.