Abstract
The single-layer reduction (SLR) model computes the normalized phase constant (β/β 0), dielectric loss (α d), and conductor loss (α c) for the Schottky contact slow-wave microstrip (SCSSM) line with accuracy about 2.0% for β/β 0 and within 0.01 dB/mm for the total loss (α t = α d + α c) as compared against the experimental results. The SLR model has been further used to analyze the normal and abnormal characteristics of a proposed Schottky contact suspended slow-wave microstrip (SCSSM) line with 22% increase in β/β 0 over the normal SCSM line. The SCSSM line could be useful in the lower range of RF for the development of compact components.
Original language | English |
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Pages (from-to) | 385-387 |
Number of pages | 3 |
Journal | IEEE Microwave and Wireless Components Letters |
Volume | 11 |
Issue number | 9 |
DOIs | |
Publication status | Published - Sept 2001 |
Externally published | Yes |
Keywords
- MICs
- Schottky contact
- Suspended Schottky contact microstrip line