Propagation characteristics of Schottky contact suspended slow-wave microstrip line

A. K. Verma*, Nasimuddin

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

2 Citations (Scopus)

Abstract

The single-layer reduction (SLR) model computes the normalized phase constant (β/β 0), dielectric loss (α d), and conductor loss (α c) for the Schottky contact slow-wave microstrip (SCSSM) line with accuracy about 2.0% for β/β 0 and within 0.01 dB/mm for the total loss (α t = α d + α c) as compared against the experimental results. The SLR model has been further used to analyze the normal and abnormal characteristics of a proposed Schottky contact suspended slow-wave microstrip (SCSSM) line with 22% increase in β/β 0 over the normal SCSM line. The SCSSM line could be useful in the lower range of RF for the development of compact components.

Original languageEnglish
Pages (from-to)385-387
Number of pages3
JournalIEEE Microwave and Wireless Components Letters
Volume11
Issue number9
DOIs
Publication statusPublished - Sep 2001
Externally publishedYes

Keywords

  • MICs
  • Schottky contact
  • Suspended Schottky contact microstrip line

Fingerprint Dive into the research topics of 'Propagation characteristics of Schottky contact suspended slow-wave microstrip line'. Together they form a unique fingerprint.

Cite this