Abstract
The single-layer reduction (SLR) model computes the normalized phase constant (β/β 0), dielectric loss (α d), and conductor loss (α c) for the Schottky contact slow-wave microstrip (SCSSM) line with accuracy about 2.0% for β/β 0 and within 0.01 dB/mm for the total loss (α t = α d + α c) as compared against the experimental results. The SLR model has been further used to analyze the normal and abnormal characteristics of a proposed Schottky contact suspended slow-wave microstrip (SCSSM) line with 22% increase in β/β 0 over the normal SCSM line. The SCSSM line could be useful in the lower range of RF for the development of compact components.
| Original language | English |
|---|---|
| Pages (from-to) | 385-387 |
| Number of pages | 3 |
| Journal | IEEE Microwave and Wireless Components Letters |
| Volume | 11 |
| Issue number | 9 |
| DOIs | |
| Publication status | Published - Sept 2001 |
| Externally published | Yes |
Keywords
- MICs
- Schottky contact
- Suspended Schottky contact microstrip line