Pulsed device measurements and applications

Jonathan Scott*, James Grantley Rathmell, Anthony Parker, Mohamed Sayed

*Corresponding author for this work

Research output: Contribution to journalArticle

61 Citations (Scopus)

Abstract

A pulsed measurement system can provide more than just isothermal characteristic data. An off-the-shelf system can determine rapidly the timing necessary for both pulsed-I-V and pulsed-S-parameter measurements to be isothermal and isodynamic. Instantaneous channel temperature may be determined. Thermal and charge-trapping effects can be separated and time constants measured. Full gain-derivative surfaces can be obtained far more efficiently than by spectral sweep measurements. Characteristics and transient effects following excursions beyond the safe-operating-area and into breakdown may be observed nondestructively.

Original languageEnglish
Pages (from-to)2718-2723
Number of pages6
JournalIEEE Transactions on Microwave Theory and Techniques
Volume44
Issue number12 PART 2
DOIs
Publication statusPublished - 1996
Externally publishedYes

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