Pulsed device measurements and applications

Jonathan Scott; James Grantley Rathmell; Anthony Parker; Mohamed Sayed

doi:10.1109/22.554657

Pulsed device measurements and applications

Jonathan Scott^*, James Grantley Rathmell, Anthony Parker, Mohamed Sayed

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

62 Citations (Scopus)

Abstract

A pulsed measurement system can provide more than just isothermal characteristic data. An off-the-shelf system can determine rapidly the timing necessary for both pulsed-I-V and pulsed-S-parameter measurements to be isothermal and isodynamic. Instantaneous channel temperature may be determined. Thermal and charge-trapping effects can be separated and time constants measured. Full gain-derivative surfaces can be obtained far more efficiently than by spectral sweep measurements. Characteristics and transient effects following excursions beyond the safe-operating-area and into breakdown may be observed nondestructively.

Original language	English
Pages (from-to)	2718-2723
Number of pages	6
Journal	IEEE Transactions on Microwave Theory and Techniques
Volume	44
Issue number	12 PART 2
DOIs	https://doi.org/10.1109/22.554657
Publication status	Published - 1996
Externally published	Yes

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AU - Scott, Jonathan

AU - Rathmell, James Grantley

AU - Parker, Anthony

AU - Sayed, Mohamed

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AB - A pulsed measurement system can provide more than just isothermal characteristic data. An off-the-shelf system can determine rapidly the timing necessary for both pulsed-I-V and pulsed-S-parameter measurements to be isothermal and isodynamic. Instantaneous channel temperature may be determined. Thermal and charge-trapping effects can be separated and time constants measured. Full gain-derivative surfaces can be obtained far more efficiently than by spectral sweep measurements. Characteristics and transient effects following excursions beyond the safe-operating-area and into breakdown may be observed nondestructively.

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M3 - Article

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JO - IEEE Transactions on Microwave Theory and Techniques

JF - IEEE Transactions on Microwave Theory and Techniques

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ER -

Pulsed device measurements and applications

Abstract

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