Pulsed measurements

Anthony E. Parker, James G. Rathmell, Jonathan B. Scott

Research output: Chapter in Book/Report/Conference proceedingChapter

Original languageEnglish
Title of host publicationRF and microwave circuits, measurements, and modeling
EditorsMike Golio
Place of PublicationBoca Raton, Florida
PublisherCRC Press LLC
Pages1-30
Edition2nd
ISBN (Print)9780849372186
Publication statusPublished - 2008

Publication series

NameThe Electrical Engineering Handbook Series
PublisherCRC Press LLC

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