Quantitative pixe microanalysis of geological matemal using the CSIRO proton microprobe

C. G. Ryan*, D. R. Cousens, S. H. Sie, W. L. Griffin, G. F. Suter, E. Clayton

*Corresponding author for this work

Research output: Contribution to journalArticle

267 Citations (Scopus)

Abstract

The proton microprobe opens up new areas of geoscience research, that demand an efficient quantitative PIXE analysis method for trace element levels down to the limits of detection. The method developed at the HIAF laboratory reliably treats statistical fluctuations to provide quantitative PIXE microanalysis down to these levels. The software package (GEO-PIXE) that supports this standardless analysis procedure includes secondary X-ray fluorescence, and is structured to process the large numbers of analyses required in many geoscience applications. Analyses of standard rocks demonstrate the accuracy of the method, and highlight the problems associated with the use of standards in trace element analysis.

Original languageEnglish
Pages (from-to)55-71
Number of pages17
JournalNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Volume47
Issue number1
DOIs
Publication statusPublished - 1 Mar 1990
Externally publishedYes

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