Quantum gate characterization in an extended Hilbert space

Peter P. Rohde; G. J. Pryde; J. L. O'Brien; Timothy C. Ralph

Quantum gate characterization in an extended Hilbert space

Peter P. Rohde, G. J. Pryde, J. L. O'Brien, Timothy C. Ralph

Research output: Chapter in Book/Report/Conference proceeding › Conference proceeding contribution › peer-review

Abstract

We describe an approach for characterizing optical quantum gates, by constructing models which incorporate mode-matching effects. Quantum process tomography is then performed on the model. The techniques can be generalized to other quantum computing architectures.

Original language	English
Title of host publication	2005 Quantum Electronics and Laser Science Conference (QELS)
Publisher	Optical Society of America (OSA)
Pages	7-9
Number of pages	3
Volume	1
ISBN (Print)	1557527709, 9781557527707
Publication status	Published - 2005
Event	Quantum Electronics and Laser Science Conference, QELS 2005 - Baltimore, MD, United States Duration: 22 May 2005 → 22 May 2005

Other

Other	Quantum Electronics and Laser Science Conference, QELS 2005
Country/Territory	United States
City	Baltimore, MD
Period	22/05/05 → 22/05/05

Cite this

@inproceedings{8646ec542ce54cd2889bc8312141be9e,

title = "Quantum gate characterization in an extended Hilbert space",

abstract = "We describe an approach for characterizing optical quantum gates, by constructing models which incorporate mode-matching effects. Quantum process tomography is then performed on the model. The techniques can be generalized to other quantum computing architectures.",

author = "Rohde, {Peter P.} and Pryde, {G. J.} and O'Brien, {J. L.} and Ralph, {Timothy C.}",

year = "2005",

language = "English",

isbn = "1557527709",

volume = "1",

pages = "7--9",

booktitle = "2005 Quantum Electronics and Laser Science Conference (QELS)",

publisher = "Optical Society of America (OSA)",

address = "United States",

note = "Quantum Electronics and Laser Science Conference, QELS 2005 ; Conference date: 22-05-2005 Through 22-05-2005",

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AU - Rohde, Peter P.

AU - Pryde, G. J.

AU - O'Brien, J. L.

AU - Ralph, Timothy C.

PY - 2005

Y1 - 2005

N2 - We describe an approach for characterizing optical quantum gates, by constructing models which incorporate mode-matching effects. Quantum process tomography is then performed on the model. The techniques can be generalized to other quantum computing architectures.

AB - We describe an approach for characterizing optical quantum gates, by constructing models which incorporate mode-matching effects. Quantum process tomography is then performed on the model. The techniques can be generalized to other quantum computing architectures.

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UR - http://www.scopus.com/inward/record.url?scp=84899579767&partnerID=8YFLogxK

M3 - Conference proceeding contribution

AN - SCOPUS:84899579767

SN - 1557527709

SN - 9781557527707

VL - 1

SP - 7

EP - 9

BT - 2005 Quantum Electronics and Laser Science Conference (QELS)

PB - Optical Society of America (OSA)

T2 - Quantum Electronics and Laser Science Conference, QELS 2005

Y2 - 22 May 2005 through 22 May 2005

ER -

Quantum gate characterization in an extended Hilbert space

Abstract

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