Quantum gate characterization in an extended Hilbert space

Peter P. Rohde, G. J. Pryde, J. L. O'Brien, Timothy C. Ralph

Research output: Chapter in Book/Report/Conference proceedingConference proceeding contributionpeer-review

Abstract

We describe an approach for characterizing optical quantum gates, by constructing models which incorporate mode-matching effects. Quantum process tomography is then performed on the model. The techniques can be generalized to other quantum computing architectures.

Original languageEnglish
Title of host publication2005 Quantum Electronics and Laser Science Conference (QELS)
PublisherOptical Society of America (OSA)
Pages7-9
Number of pages3
Volume1
ISBN (Print)1557527709, 9781557527707
Publication statusPublished - 2005
EventQuantum Electronics and Laser Science Conference, QELS 2005 - Baltimore, MD, United States
Duration: 22 May 200522 May 2005

Other

OtherQuantum Electronics and Laser Science Conference, QELS 2005
CountryUnited States
CityBaltimore, MD
Period22/05/0522/05/05

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