Recent advances in subaperture stitching interferometry

Paul E. Murphy; Greg W. Forbes; Jon F. Fleig; Dragisha Miladinovic; Gary DeVries; Stephen O'Donohue

doi:10.1364/OFT.2006.OFWC2

Recent advances in subaperture stitching interferometry

Paul E. Murphy, Greg W. Forbes, Jon F. Fleig, Dragisha Miladinovic, Gary DeVries, Stephen O'Donohue

Research output: Chapter in Book/Report/Conference proceeding › Conference proceeding contribution › peer-review

10 Citations (Scopus)

Abstract

It is well known that stitching can boost the aperture capability. Stitching can also improve the accuracy, lateral resolution, and testable aspheric departure. We demonstrate these improvements on our subaperture stitching interferometer (SSI®).

Original language	English
Title of host publication	Optical Fabrication and Testing, OFT 2006
Place of Publication	Washington, DC
Publisher	Optical Society of America (OSA)
Pages	1-3
Number of pages	3
ISBN (Print)	1557528187, 9781557528186
DOIs	https://doi.org/10.1364/OFT.2006.OFWC2
Publication status	Published - 2006
Externally published	Yes
Event	Optical Fabrication and Testing, OFT 2006 - Rochester, NY, United States Duration: 10 Oct 2006 → 10 Oct 2006

Other

Other	Optical Fabrication and Testing, OFT 2006
Country/Territory	United States
City	Rochester, NY
Period	10/10/06 → 10/10/06

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10.1364/OFT.2006.OFWC2

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title = "Recent advances in subaperture stitching interferometry",

abstract = "It is well known that stitching can boost the aperture capability. Stitching can also improve the accuracy, lateral resolution, and testable aspheric departure. We demonstrate these improvements on our subaperture stitching interferometer (SSI{\textregistered}).",

author = "Murphy, {Paul E.} and Forbes, {Greg W.} and Fleig, {Jon F.} and Dragisha Miladinovic and Gary DeVries and Stephen O'Donohue",

year = "2006",

doi = "10.1364/OFT.2006.OFWC2",

language = "English",

isbn = "1557528187",

pages = "1--3",

booktitle = "Optical Fabrication and Testing, OFT 2006",

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address = "United States",

note = "Optical Fabrication and Testing, OFT 2006 ; Conference date: 10-10-2006 Through 10-10-2006",

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T1 - Recent advances in subaperture stitching interferometry

AU - Murphy, Paul E.

AU - Forbes, Greg W.

AU - Fleig, Jon F.

AU - Miladinovic, Dragisha

AU - DeVries, Gary

AU - O'Donohue, Stephen

PY - 2006

Y1 - 2006

N2 - It is well known that stitching can boost the aperture capability. Stitching can also improve the accuracy, lateral resolution, and testable aspheric departure. We demonstrate these improvements on our subaperture stitching interferometer (SSI®).

AB - It is well known that stitching can boost the aperture capability. Stitching can also improve the accuracy, lateral resolution, and testable aspheric departure. We demonstrate these improvements on our subaperture stitching interferometer (SSI®).

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U2 - 10.1364/OFT.2006.OFWC2

DO - 10.1364/OFT.2006.OFWC2

M3 - Conference proceeding contribution

SN - 1557528187

SN - 9781557528186

SP - 1

EP - 3

BT - Optical Fabrication and Testing, OFT 2006

PB - Optical Society of America (OSA)

CY - Washington, DC

T2 - Optical Fabrication and Testing, OFT 2006

Y2 - 10 October 2006 through 10 October 2006

ER -

Recent advances in subaperture stitching interferometry

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