Reduction of threading dislocation density in sputtered Ge/Si(100) epitaxial films by continuous-wave diode laser-induced recrystallization

Ziheng Liu*, Xiaojing Hao, Jialiang Huang, Anita Ho-Baillie, Martin A. Green

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

2 Citations (Scopus)

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Engineering & Materials Science

Chemistry