Reliability simulation and analysis of important RF circuits using cadence relxpert

Dhawal Mahajan; Vaibhav Ruparelia

doi:10.1109/CONECCT.2018.8482396

Reliability simulation and analysis of important RF circuits using cadence relxpert

Dhawal Mahajan, Vaibhav Ruparelia

School of Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference proceeding contribution › peer-review

13 Citations (Scopus)

Abstract

Reliability studies have conventionally been limited to process qualification and as an input to design guides that come with the PDKs. However, Reliability concerns have increased in the present state-of-the-art chip designs due to scaling, new materials and devices, more demanding mission profiles, and increasing constraints of time and money. RelXpert is a tool developed by Cadence to simulate MOSFET devices for device degradation due to various reliability mechanisms like HCI, NBTWBTI, etc. In this study, we have analyzed key building blocks used in RF receiver front-end such as Cascode and Folded-Cascode LNA amplifiers, Cross-coupled LC VCO and Mixer using Cadence RelXpert and GLOBALFOUNDRIES 45nm RFSOI PDK models. The simulations were run for 10-year EOL (End Of Life) criteria. Also, some insights have been presented to make designs more robust. The model equations used are based on energy driven model for HCI. In addition, there is a standard NBTI model with relaxation effects modeled for AC stress.

Original language	English
Title of host publication	2018 IEEE International Conference on Electronics, Computing and Communication Technologies (CONECCT)
Place of Publication	Piscataway, NJ
Publisher	Institute of Electrical and Electronics Engineers (IEEE)
Pages	1-6
Number of pages	6
ISBN (Electronic)	9781538611128
ISBN (Print)	9781538611135
DOIs	https://doi.org/10.1109/CONECCT.2018.8482396
Publication status	Published - 2018
Event	2018 IEEE International Conference on Electronics, Computing and Communication Technologies, CONECCT 2018 - Bangalore, India Duration: 16 Mar 2018 → 17 Mar 2018

Conference

Conference	2018 IEEE International Conference on Electronics, Computing and Communication Technologies, CONECCT 2018
Country/Territory	India
City	Bangalore
Period	16/03/18 → 17/03/18

Keywords

RF Reliability
RelXpert
Cadence ADE
DC bias operating point (OP)
RF Receiver Frontend
Hot Carrier(HC) degradation
NBTI
PBTI
TDDB
Cascode LNA
VCO
regenerative degradation
Self - Heating
SOI

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10.1109/CONECCT.2018.8482396

Cite this

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title = "Reliability simulation and analysis of important RF circuits using cadence relxpert",

abstract = "Reliability studies have conventionally been limited to process qualification and as an input to design guides that come with the PDKs. However, Reliability concerns have increased in the present state-of-the-art chip designs due to scaling, new materials and devices, more demanding mission profiles, and increasing constraints of time and money. RelXpert is a tool developed by Cadence to simulate MOSFET devices for device degradation due to various reliability mechanisms like HCI, NBTWBTI, etc. In this study, we have analyzed key building blocks used in RF receiver front-end such as Cascode and Folded-Cascode LNA amplifiers, Cross-coupled LC VCO and Mixer using Cadence RelXpert and GLOBALFOUNDRIES 45nm RFSOI PDK models. The simulations were run for 10-year EOL (End Of Life) criteria. Also, some insights have been presented to make designs more robust. The model equations used are based on energy driven model for HCI. In addition, there is a standard NBTI model with relaxation effects modeled for AC stress.",

keywords = "RF Reliability, RelXpert, Cadence ADE, DC bias operating point (OP), RF Receiver Frontend, Hot Carrier(HC) degradation, NBTI, PBTI, TDDB, Cascode LNA, VCO, regenerative degradation, Self - Heating, SOI",

author = "Dhawal Mahajan and Vaibhav Ruparelia",

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language = "English",

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booktitle = "2018 IEEE International Conference on Electronics, Computing and Communication Technologies (CONECCT)",

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note = "2018 IEEE International Conference on Electronics, Computing and Communication Technologies, CONECCT 2018 ; Conference date: 16-03-2018 Through 17-03-2018",

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Mahajan, D & Ruparelia, V 2018, Reliability simulation and analysis of important RF circuits using cadence relxpert. in 2018 IEEE International Conference on Electronics, Computing and Communication Technologies (CONECCT). Institute of Electrical and Electronics Engineers (IEEE), Piscataway, NJ, pp. 1-6, 2018 IEEE International Conference on Electronics, Computing and Communication Technologies, CONECCT 2018, Bangalore, India, 16/03/18. https://doi.org/10.1109/CONECCT.2018.8482396

Reliability simulation and analysis of important RF circuits using cadence relxpert. / Mahajan, Dhawal; Ruparelia, Vaibhav.
2018 IEEE International Conference on Electronics, Computing and Communication Technologies (CONECCT). Piscataway, NJ: Institute of Electrical and Electronics Engineers (IEEE), 2018. p. 1-6.

Research output: Chapter in Book/Report/Conference proceeding › Conference proceeding contribution › peer-review

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KW - RF Reliability

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KW - Hot Carrier(HC) degradation

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KW - TDDB

KW - Cascode LNA

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EP - 6

BT - 2018 IEEE International Conference on Electronics, Computing and Communication Technologies (CONECCT)

PB - Institute of Electrical and Electronics Engineers (IEEE)

CY - Piscataway, NJ

T2 - 2018 IEEE International Conference on Electronics, Computing and Communication Technologies, CONECCT 2018

Y2 - 16 March 2018 through 17 March 2018

ER -

Reliability simulation and analysis of important RF circuits using cadence relxpert

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