Reliability simulation and analysis of important RF circuits using cadence relxpert

Dhawal Mahajan, Vaibhav Ruparelia

Research output: Chapter in Book/Report/Conference proceedingConference proceeding contribution

3 Citations (Scopus)

Abstract

Reliability studies have conventionally been limited to process qualification and as an input to design guides that come with the PDKs. However, Reliability concerns have increased in the present state-of-the-art chip designs due to scaling, new materials and devices, more demanding mission profiles, and increasing constraints of time and money. RelXpert is a tool developed by Cadence to simulate MOSFET devices for device degradation due to various reliability mechanisms like HCI, NBTWBTI, etc. In this study, we have analyzed key building blocks used in RF receiver front-end such as Cascode and Folded-Cascode LNA amplifiers, Cross-coupled LC VCO and Mixer using Cadence RelXpert and GLOBALFOUNDRIES 45nm RFSOI PDK models. The simulations were run for 10-year EOL (End Of Life) criteria. Also, some insights have been presented to make designs more robust. The model equations used are based on energy driven model for HCI. In addition, there is a standard NBTI model with relaxation effects modeled for AC stress.

Original languageEnglish
Title of host publication2018 IEEE International Conference on Electronics, Computing and Communication Technologies (CONECCT)
Place of PublicationPiscataway, NJ
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Pages1-6
Number of pages6
ISBN (Electronic)9781538611128
ISBN (Print)9781538611135
DOIs
Publication statusPublished - 2018
Event2018 IEEE International Conference on Electronics, Computing and Communication Technologies, CONECCT 2018 - Bangalore, India
Duration: 16 Mar 201817 Mar 2018

Conference

Conference2018 IEEE International Conference on Electronics, Computing and Communication Technologies, CONECCT 2018
CountryIndia
CityBangalore
Period16/03/1817/03/18

Keywords

  • RF Reliability
  • RelXpert
  • Cadence ADE
  • DC bias operating point (OP)
  • RF Receiver Frontend
  • Hot Carrier(HC) degradation
  • NBTI
  • PBTI
  • TDDB
  • Cascode LNA
  • VCO
  • regenerative degradation
  • Self - Heating
  • SOI

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  • Cite this

    Mahajan, D., & Ruparelia, V. (2018). Reliability simulation and analysis of important RF circuits using cadence relxpert. In 2018 IEEE International Conference on Electronics, Computing and Communication Technologies (CONECCT) (pp. 1-6). Piscataway, NJ: Institute of Electrical and Electronics Engineers (IEEE). https://doi.org/10.1109/CONECCT.2018.8482396