TY - JOUR
T1 - Residue number system scaling schemes
AU - Kong, Yinan
AU - Phillips, Braden
N1 - Copyright 2005 Society of Photo Optical Instrumentation Engineers. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited.
PY - 2005
Y1 - 2005
N2 - Although multiplication and addition can be very efficiently implemented in a Residue Number System (RNS), scaling (division by a constant) is much more computationally complex. This limitation has prevented wider adoption of RNS. In this paper, different RNS scaling schemes are surveyed and compared. It is found that scaling in RNS has been performed with the aid of conversions to and from RNS, base extensions between modulus sets, and redundant RNS channels. Recent advances in RNS scaling theory have reduced the overhead of such measures but RNS scaling still falls short of the ideal: a simple operation performed entirely within the RNS channels.
AB - Although multiplication and addition can be very efficiently implemented in a Residue Number System (RNS), scaling (division by a constant) is much more computationally complex. This limitation has prevented wider adoption of RNS. In this paper, different RNS scaling schemes are surveyed and compared. It is found that scaling in RNS has been performed with the aid of conversions to and from RNS, base extensions between modulus sets, and redundant RNS channels. Recent advances in RNS scaling theory have reduced the overhead of such measures but RNS scaling still falls short of the ideal: a simple operation performed entirely within the RNS channels.
UR - http://www.scopus.com/inward/record.url?scp=20044380191&partnerID=8YFLogxK
U2 - 10.1117/12.582137
DO - 10.1117/12.582137
M3 - Article
AN - SCOPUS:20044380191
VL - 5649
SP - 525
EP - 536
JO - Proceedings of SPIE - The International Society for Optical Engineering
JF - Proceedings of SPIE - The International Society for Optical Engineering
SN - 0277-786X
IS - PART 2
M1 - 82
ER -