Abstract
We present a method whereby spatial variations in the resistivity of bulk conductive specimens may be detected on the same scale as the microstructural variations from which they arise. This technique, a new development of scanning tunneling potentiometry, offers significant benefits for microstructural characterization and for investigation of microstructure/resistivity relationships in metallic materials.
| Original language | English |
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| Pages (from-to) | 15-20 |
| Number of pages | 6 |
| Journal | Materials Research Society Symposium - Proceedings |
| Volume | 500 |
| Publication status | Published - 1998 |
| Externally published | Yes |