Resistometric mapping using a scanning tunneling microscope

C. I. Lang; J. Tapson

Resistometric mapping using a scanning tunneling microscope

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

Abstract

We present a method whereby spatial variations in the resistivity of bulk conductive specimens may be detected on the same scale as the microstructural variations from which they arise. This technique, a new development of scanning tunneling potentiometry, offers significant benefits for microstructural characterization and for investigation of microstructure/resistivity relationships in metallic materials.

Original language	English
Pages (from-to)	15-20
Number of pages	6
Journal	Materials Research Society Symposium - Proceedings
Volume	500
Publication status	Published - 1998
Externally published	Yes

Cite this

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title = "Resistometric mapping using a scanning tunneling microscope",

abstract = "We present a method whereby spatial variations in the resistivity of bulk conductive specimens may be detected on the same scale as the microstructural variations from which they arise. This technique, a new development of scanning tunneling potentiometry, offers significant benefits for microstructural characterization and for investigation of microstructure/resistivity relationships in metallic materials.",

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AU - Lang, C. I.

AU - Tapson, J.

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AB - We present a method whereby spatial variations in the resistivity of bulk conductive specimens may be detected on the same scale as the microstructural variations from which they arise. This technique, a new development of scanning tunneling potentiometry, offers significant benefits for microstructural characterization and for investigation of microstructure/resistivity relationships in metallic materials.

UR - https://www.scopus.com/pages/publications/0032302058

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SN - 0272-9172

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SP - 15

EP - 20

JO - Materials Research Society Symposium - Proceedings

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Resistometric mapping using a scanning tunneling microscope

Abstract

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