Resonator power to frequency conversion in a cryogenic sapphire oscillator

Nitin R. Nand*, Stephen R. Parker, Eugene N. Ivanov, Jean Michel Le Floch, John G. Hartnett, Michael E. Tobar

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

14 Citations (Scopus)

Abstract

We report on the measurement and characterization of power to frequency conversion in the resonant mode of a cryogenic sapphire loaded cavity resonator, which is used as the frequency discriminating element of a loop oscillator circuit. Fluctuations of power incident on the resonator lead to changes in radiation pressure and temperature in the sapphire dielectric, both of which contribute to a shift in the resonance frequency. We measure a modulation and temperature independent radiation pressure induced power to frequency sensitivity of -0.15 Hz/mW and find that this is the primary factor limiting the stability of the resonator frequency.

Original languageEnglish
Article number043502
Pages (from-to)1-4
Number of pages4
JournalApplied Physics Letters
Volume103
Issue number4
DOIs
Publication statusPublished - 22 Jul 2013

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