Resonator power to frequency conversion in a cryogenic sapphire oscillator

Nitin R. Nand; Stephen R. Parker; Eugene N. Ivanov; Jean Michel Le Floch; John G. Hartnett; Michael E. Tobar

doi:10.1063/1.4816284

Resonator power to frequency conversion in a cryogenic sapphire oscillator

Nitin R. Nand^*, Stephen R. Parker, Eugene N. Ivanov, Jean Michel Le Floch, John G. Hartnett, Michael E. Tobar

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

17 Citations (Scopus)

Abstract

We report on the measurement and characterization of power to frequency conversion in the resonant mode of a cryogenic sapphire loaded cavity resonator, which is used as the frequency discriminating element of a loop oscillator circuit. Fluctuations of power incident on the resonator lead to changes in radiation pressure and temperature in the sapphire dielectric, both of which contribute to a shift in the resonance frequency. We measure a modulation and temperature independent radiation pressure induced power to frequency sensitivity of -0.15 Hz/mW and find that this is the primary factor limiting the stability of the resonator frequency.

Original language	English
Article number	043502
Pages (from-to)	1-4
Number of pages	4
Journal	Applied Physics Letters
Volume	103
Issue number	4
DOIs	https://doi.org/10.1063/1.4816284
Publication status	Published - 22 Jul 2013

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abstract = "We report on the measurement and characterization of power to frequency conversion in the resonant mode of a cryogenic sapphire loaded cavity resonator, which is used as the frequency discriminating element of a loop oscillator circuit. Fluctuations of power incident on the resonator lead to changes in radiation pressure and temperature in the sapphire dielectric, both of which contribute to a shift in the resonance frequency. We measure a modulation and temperature independent radiation pressure induced power to frequency sensitivity of -0.15 Hz/mW and find that this is the primary factor limiting the stability of the resonator frequency.",

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AU - Nand, Nitin R.

AU - Parker, Stephen R.

AU - Ivanov, Eugene N.

AU - Le Floch, Jean Michel

AU - Hartnett, John G.

AU - Tobar, Michael E.

PY - 2013/7/22

Y1 - 2013/7/22

N2 - We report on the measurement and characterization of power to frequency conversion in the resonant mode of a cryogenic sapphire loaded cavity resonator, which is used as the frequency discriminating element of a loop oscillator circuit. Fluctuations of power incident on the resonator lead to changes in radiation pressure and temperature in the sapphire dielectric, both of which contribute to a shift in the resonance frequency. We measure a modulation and temperature independent radiation pressure induced power to frequency sensitivity of -0.15 Hz/mW and find that this is the primary factor limiting the stability of the resonator frequency.

AB - We report on the measurement and characterization of power to frequency conversion in the resonant mode of a cryogenic sapphire loaded cavity resonator, which is used as the frequency discriminating element of a loop oscillator circuit. Fluctuations of power incident on the resonator lead to changes in radiation pressure and temperature in the sapphire dielectric, both of which contribute to a shift in the resonance frequency. We measure a modulation and temperature independent radiation pressure induced power to frequency sensitivity of -0.15 Hz/mW and find that this is the primary factor limiting the stability of the resonator frequency.

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Resonator power to frequency conversion in a cryogenic sapphire oscillator

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