Robust extraction of access elements for broadband small-signal FET models

Anthony E. Parker; Simon J. Mahon

doi:10.1109/MWSYM.2007.380057

Robust extraction of access elements for broadband small-signal FET models

Anthony E. Parker^*, Simon J. Mahon

^*Corresponding author for this work

Department of Physics and Astronomy

Research output: Chapter in Book/Report/Conference proceeding › Conference proceeding contribution › peer-review

16 Citations (Scopus)

59 Downloads (Pure)

Abstract

A small-signal transistor model extraction technique is proposed. It partitions access and intrinsic elements with a more accurate network for the intrinsic section. This resolves problems of nonphysical parameters and inconsistencies across bias. The technique uses low gate and zero drain bias measurements to directly determine an access network. There is no need to apply electrical stress to the device during measurement. The procedure is deterministic.

Original language	English
Title of host publication	2007 IEEE MTT-S International Microwave Symposium Digest
Editors	Rob Hamilton
Place of Publication	Piscataway, NJ
Publisher	Institute of Electrical and Electronics Engineers (IEEE)
Pages	783-786
Number of pages	4
ISBN (Print)	1424406889, 9781424406883
DOIs	https://doi.org/10.1109/MWSYM.2007.380057
Publication status	Published - 2007
Event	2007 IEEE MTT-S International Microwave Symposium, IMS 2007 - Honolulu, HI, United States Duration: 3 Jun 2007 → 8 Jun 2007

Other

Other	2007 IEEE MTT-S International Microwave Symposium, IMS 2007
Country	United States
City	Honolulu, HI
Period	3/06/07 → 8/06/07

Bibliographical note

Copyright 2007 IEEE. Reprinted from Proceedings of the IEEE MTT-S international microwave symposium (IMS 2007). This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of Macquarie University's products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to pubs-permissions@ieee.org. By choosing to view this document, you agree to all provisions of the copyright laws protecting it.

Access to Document

10.1109/MWSYM.2007.380057

Publisher version (open access).pdfFinal published version, 1.73 MB

Link to publication in Scopus

Cite this

@inproceedings{7091a190d84b4f36a80953ed39af742e,

title = "Robust extraction of access elements for broadband small-signal FET models",

abstract = "A small-signal transistor model extraction technique is proposed. It partitions access and intrinsic elements with a more accurate network for the intrinsic section. This resolves problems of nonphysical parameters and inconsistencies across bias. The technique uses low gate and zero drain bias measurements to directly determine an access network. There is no need to apply electrical stress to the device during measurement. The procedure is deterministic.",

author = "Parker, {Anthony E.} and Mahon, {Simon J.}",

note = "Copyright 2007 IEEE. Reprinted from Proceedings of the IEEE MTT-S international microwave symposium (IMS 2007). This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of Macquarie University's products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to pubs-permissions@ieee.org. By choosing to view this document, you agree to all provisions of the copyright laws protecting it.; 2007 IEEE MTT-S International Microwave Symposium, IMS 2007 ; Conference date: 03-06-2007 Through 08-06-2007",

year = "2007",

doi = "10.1109/MWSYM.2007.380057",

language = "English",

isbn = "1424406889",

pages = "783--786",

editor = "Rob Hamilton",

booktitle = "2007 IEEE MTT-S International Microwave Symposium Digest",

publisher = "Institute of Electrical and Electronics Engineers (IEEE)",

address = "United States",

}

Parker, AE & Mahon, SJ 2007, Robust extraction of access elements for broadband small-signal FET models. in R Hamilton (ed.), 2007 IEEE MTT-S International Microwave Symposium Digest., 4263936, Institute of Electrical and Electronics Engineers (IEEE), Piscataway, NJ, pp. 783-786, 2007 IEEE MTT-S International Microwave Symposium, IMS 2007, Honolulu, HI, United States, 3/06/07. https://doi.org/10.1109/MWSYM.2007.380057

Robust extraction of access elements for broadband small-signal FET models. / Parker, Anthony E.; Mahon, Simon J.

2007 IEEE MTT-S International Microwave Symposium Digest. ed. / Rob Hamilton. Piscataway, NJ : Institute of Electrical and Electronics Engineers (IEEE), 2007. p. 783-786 4263936.

Research output: Chapter in Book/Report/Conference proceeding › Conference proceeding contribution › peer-review

TY - GEN

T1 - Robust extraction of access elements for broadband small-signal FET models

AU - Parker, Anthony E.

AU - Mahon, Simon J.

N1 - Copyright 2007 IEEE. Reprinted from Proceedings of the IEEE MTT-S international microwave symposium (IMS 2007). This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of Macquarie University's products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to pubs-permissions@ieee.org. By choosing to view this document, you agree to all provisions of the copyright laws protecting it.

PY - 2007

Y1 - 2007

N2 - A small-signal transistor model extraction technique is proposed. It partitions access and intrinsic elements with a more accurate network for the intrinsic section. This resolves problems of nonphysical parameters and inconsistencies across bias. The technique uses low gate and zero drain bias measurements to directly determine an access network. There is no need to apply electrical stress to the device during measurement. The procedure is deterministic.

AB - A small-signal transistor model extraction technique is proposed. It partitions access and intrinsic elements with a more accurate network for the intrinsic section. This resolves problems of nonphysical parameters and inconsistencies across bias. The technique uses low gate and zero drain bias measurements to directly determine an access network. There is no need to apply electrical stress to the device during measurement. The procedure is deterministic.

UR - http://www.scopus.com/inward/record.url?scp=34748859247&partnerID=8YFLogxK

U2 - 10.1109/MWSYM.2007.380057

DO - 10.1109/MWSYM.2007.380057

M3 - Conference proceeding contribution

AN - SCOPUS:34748859247

SN - 1424406889

SN - 9781424406883

SP - 783

EP - 786

BT - 2007 IEEE MTT-S International Microwave Symposium Digest

A2 - Hamilton, Rob

PB - Institute of Electrical and Electronics Engineers (IEEE)

CY - Piscataway, NJ

T2 - 2007 IEEE MTT-S International Microwave Symposium, IMS 2007

Y2 - 3 June 2007 through 8 June 2007

ER -

Robust extraction of access elements for broadband small-signal FET models

Abstract

Other

Bibliographical note

Access to Document

Fingerprint

Cite this