TY - GEN
T1 - Robust extraction of access elements for broadband small-signal FET models
AU - Parker, Anthony E.
AU - Mahon, Simon J.
N1 - Copyright 2007 IEEE. Reprinted from Proceedings of the IEEE MTT-S international microwave symposium (IMS 2007). This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of Macquarie University's products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to [email protected]. By choosing to view this document, you agree to all provisions of the copyright laws protecting it.
PY - 2007
Y1 - 2007
N2 - A small-signal transistor model extraction technique is proposed. It partitions access and intrinsic elements with a more accurate network for the intrinsic section. This resolves problems of nonphysical parameters and inconsistencies across bias. The technique uses low gate and zero drain bias measurements to directly determine an access network. There is no need to apply electrical stress to the device during measurement. The procedure is deterministic.
AB - A small-signal transistor model extraction technique is proposed. It partitions access and intrinsic elements with a more accurate network for the intrinsic section. This resolves problems of nonphysical parameters and inconsistencies across bias. The technique uses low gate and zero drain bias measurements to directly determine an access network. There is no need to apply electrical stress to the device during measurement. The procedure is deterministic.
UR - http://www.scopus.com/inward/record.url?scp=34748859247&partnerID=8YFLogxK
U2 - 10.1109/MWSYM.2007.380057
DO - 10.1109/MWSYM.2007.380057
M3 - Conference proceeding contribution
AN - SCOPUS:34748859247
SN - 1424406889
SN - 9781424406883
SP - 783
EP - 786
BT - 2007 IEEE MTT-S International Microwave Symposium Digest
A2 - Hamilton, Rob
PB - Institute of Electrical and Electronics Engineers (IEEE)
CY - Piscataway, NJ
T2 - 2007 IEEE MTT-S International Microwave Symposium, IMS 2007
Y2 - 3 June 2007 through 8 June 2007
ER -