Robust extraction of access elements for broadband small-signal FET models

Anthony E. Parker*, Simon J. Mahon

*Corresponding author for this work

    Research output: Chapter in Book/Report/Conference proceedingConference proceeding contributionpeer-review

    20 Citations (Scopus)
    72 Downloads (Pure)

    Abstract

    A small-signal transistor model extraction technique is proposed. It partitions access and intrinsic elements with a more accurate network for the intrinsic section. This resolves problems of nonphysical parameters and inconsistencies across bias. The technique uses low gate and zero drain bias measurements to directly determine an access network. There is no need to apply electrical stress to the device during measurement. The procedure is deterministic.

    Original languageEnglish
    Title of host publication2007 IEEE MTT-S International Microwave Symposium Digest
    EditorsRob Hamilton
    Place of PublicationPiscataway, NJ
    PublisherInstitute of Electrical and Electronics Engineers (IEEE)
    Pages783-786
    Number of pages4
    ISBN (Print)1424406889, 9781424406883
    DOIs
    Publication statusPublished - 2007
    Event2007 IEEE MTT-S International Microwave Symposium, IMS 2007 - Honolulu, HI, United States
    Duration: 3 Jun 20078 Jun 2007

    Other

    Other2007 IEEE MTT-S International Microwave Symposium, IMS 2007
    Country/TerritoryUnited States
    CityHonolulu, HI
    Period3/06/078/06/07

    Bibliographical note

    Copyright 2007 IEEE. Reprinted from Proceedings of the IEEE MTT-S international microwave symposium (IMS 2007). This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of Macquarie University's products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to pubs-permissions@ieee.org. By choosing to view this document, you agree to all provisions of the copyright laws protecting it.

    Fingerprint

    Dive into the research topics of 'Robust extraction of access elements for broadband small-signal FET models'. Together they form a unique fingerprint.

    Cite this