Robust extraction of access elements for broadband small-signal FET models

Anthony E. Parker; Simon J. Mahon

doi:10.1109/MWSYM.2007.380057

Robust extraction of access elements for broadband small-signal FET models

Anthony E. Parker^*, Simon J. Mahon

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference proceeding contribution › peer-review

22 Citations (Scopus)

105 Downloads (Pure)

Abstract

A small-signal transistor model extraction technique is proposed. It partitions access and intrinsic elements with a more accurate network for the intrinsic section. This resolves problems of nonphysical parameters and inconsistencies across bias. The technique uses low gate and zero drain bias measurements to directly determine an access network. There is no need to apply electrical stress to the device during measurement. The procedure is deterministic.

Original language	English
Title of host publication	2007 IEEE MTT-S International Microwave Symposium Digest
Editors	Rob Hamilton
Place of Publication	Piscataway, NJ
Publisher	Institute of Electrical and Electronics Engineers (IEEE)
Pages	783-786
Number of pages	4
ISBN (Print)	1424406889, 9781424406883
DOIs	https://doi.org/10.1109/MWSYM.2007.380057
Publication status	Published - 2007
Event	2007 IEEE MTT-S International Microwave Symposium, IMS 2007 - Honolulu, HI, United States Duration: 3 Jun 2007 → 8 Jun 2007

Other

Other	2007 IEEE MTT-S International Microwave Symposium, IMS 2007
Country/Territory	United States
City	Honolulu, HI
Period	3/06/07 → 8/06/07

Bibliographical note

Copyright 2007 IEEE. Reprinted from Proceedings of the IEEE MTT-S international microwave symposium (IMS 2007). This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of Macquarie University's products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to [email protected]. By choosing to view this document, you agree to all provisions of the copyright laws protecting it.

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10.1109/MWSYM.2007.380057

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Cite this

@inproceedings{7091a190d84b4f36a80953ed39af742e,

title = "Robust extraction of access elements for broadband small-signal FET models",

abstract = "A small-signal transistor model extraction technique is proposed. It partitions access and intrinsic elements with a more accurate network for the intrinsic section. This resolves problems of nonphysical parameters and inconsistencies across bias. The technique uses low gate and zero drain bias measurements to directly determine an access network. There is no need to apply electrical stress to the device during measurement. The procedure is deterministic.",

author = "Parker, \{Anthony E.\} and Mahon, \{Simon J.\}",

note = "Copyright 2007 IEEE. Reprinted from Proceedings of the IEEE MTT-S international microwave symposium (IMS 2007). This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of Macquarie University's products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to [email protected]. By choosing to view this document, you agree to all provisions of the copyright laws protecting it.; 2007 IEEE MTT-S International Microwave Symposium, IMS 2007 ; Conference date: 03-06-2007 Through 08-06-2007",

year = "2007",

doi = "10.1109/MWSYM.2007.380057",

language = "English",

isbn = "1424406889",

pages = "783--786",

editor = "Rob Hamilton",

booktitle = "2007 IEEE MTT-S International Microwave Symposium Digest",

publisher = "Institute of Electrical and Electronics Engineers (IEEE)",

address = "United States",

}

Parker, AE & Mahon, SJ 2007, Robust extraction of access elements for broadband small-signal FET models. in R Hamilton (ed.), 2007 IEEE MTT-S International Microwave Symposium Digest., 4263936, Institute of Electrical and Electronics Engineers (IEEE), Piscataway, NJ, pp. 783-786, 2007 IEEE MTT-S International Microwave Symposium, IMS 2007, Honolulu, HI, United States, 3/06/07. https://doi.org/10.1109/MWSYM.2007.380057

Robust extraction of access elements for broadband small-signal FET models. / Parker, Anthony E.; Mahon, Simon J.
2007 IEEE MTT-S International Microwave Symposium Digest. ed. / Rob Hamilton. Piscataway, NJ: Institute of Electrical and Electronics Engineers (IEEE), 2007. p. 783-786 4263936.

Research output: Chapter in Book/Report/Conference proceeding › Conference proceeding contribution › peer-review

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AU - Mahon, Simon J.

N1 - Copyright 2007 IEEE. Reprinted from Proceedings of the IEEE MTT-S international microwave symposium (IMS 2007). This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of Macquarie University's products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to [email protected]. By choosing to view this document, you agree to all provisions of the copyright laws protecting it.

PY - 2007

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AB - A small-signal transistor model extraction technique is proposed. It partitions access and intrinsic elements with a more accurate network for the intrinsic section. This resolves problems of nonphysical parameters and inconsistencies across bias. The technique uses low gate and zero drain bias measurements to directly determine an access network. There is no need to apply electrical stress to the device during measurement. The procedure is deterministic.

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M3 - Conference proceeding contribution

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SN - 9781424406883

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BT - 2007 IEEE MTT-S International Microwave Symposium Digest

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T2 - 2007 IEEE MTT-S International Microwave Symposium, IMS 2007

Y2 - 3 June 2007 through 8 June 2007

ER -

Robust extraction of access elements for broadband small-signal FET models

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