Robustness of the new owner-tester approach for face identification experiments

Wai Han Ho, Paul Watters, Dominic Verity

Research output: Chapter in Book/Report/Conference proceedingConference proceeding contributionResearchpeer-review

Abstract

With the broad application of face identification, it is important that the performance estimated for an algorithm using a sample can be generalized to the population performance. We proposed using an Owner-Tester setup to replace the current approach for experiments on face identification (or other biometrics and pattern recognition systems). This paper looks into the robustness of the OwnerTester setup in terms of goodness of fit and performance estimation using misidentification risk - the newly suggested performance evaluation metric. Testing results have indicated that the approach is robust in term of goodness of fit and performance estimation.

LanguageEnglish
Title of host publication2007 IEEE Computer Society Conference on Computer Vision and Pattern Recognition, CVPR'07
EditorsPatrick Flynn
Place of PublicationPiscataway, NJ
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Pages1-6
Number of pages6
ISBN (Print)1424411807, 9781424411801
DOIs
Publication statusPublished - 2007
Event2007 IEEE Computer Society Conference on Computer Vision and Pattern Recognition, CVPR'07 - Minneapolis, MN, United States
Duration: 17 Jun 200722 Jun 2007

Other

Other2007 IEEE Computer Society Conference on Computer Vision and Pattern Recognition, CVPR'07
CountryUnited States
CityMinneapolis, MN
Period17/06/0722/06/07

Fingerprint

Pattern recognition systems
Biometrics
Experiments
Testing

Bibliographical note

Copyright 2007 IEEE. Reprinted from Proceedings of the 2007 IEEE conference on computer vision and pattern recognition (CVPR '07). This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of Macquarie University’s products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to pubs-permissions@ieee.org. By choosing to view this document, you agree to all provisions of the copyright laws protecting it.

Cite this

Ho, W. H., Watters, P., & Verity, D. (2007). Robustness of the new owner-tester approach for face identification experiments. In P. Flynn (Ed.), 2007 IEEE Computer Society Conference on Computer Vision and Pattern Recognition, CVPR'07 (pp. 1-6). [4270395] Piscataway, NJ: Institute of Electrical and Electronics Engineers (IEEE). https://doi.org/10.1109/CVPR.2007.383397
Ho, Wai Han ; Watters, Paul ; Verity, Dominic. / Robustness of the new owner-tester approach for face identification experiments. 2007 IEEE Computer Society Conference on Computer Vision and Pattern Recognition, CVPR'07. editor / Patrick Flynn. Piscataway, NJ : Institute of Electrical and Electronics Engineers (IEEE), 2007. pp. 1-6
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Ho, WH, Watters, P & Verity, D 2007, Robustness of the new owner-tester approach for face identification experiments. in P Flynn (ed.), 2007 IEEE Computer Society Conference on Computer Vision and Pattern Recognition, CVPR'07., 4270395, Institute of Electrical and Electronics Engineers (IEEE), Piscataway, NJ, pp. 1-6, 2007 IEEE Computer Society Conference on Computer Vision and Pattern Recognition, CVPR'07, Minneapolis, MN, United States, 17/06/07. https://doi.org/10.1109/CVPR.2007.383397

Robustness of the new owner-tester approach for face identification experiments. / Ho, Wai Han; Watters, Paul; Verity, Dominic.

2007 IEEE Computer Society Conference on Computer Vision and Pattern Recognition, CVPR'07. ed. / Patrick Flynn. Piscataway, NJ : Institute of Electrical and Electronics Engineers (IEEE), 2007. p. 1-6 4270395.

Research output: Chapter in Book/Report/Conference proceedingConference proceeding contributionResearchpeer-review

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Ho WH, Watters P, Verity D. Robustness of the new owner-tester approach for face identification experiments. In Flynn P, editor, 2007 IEEE Computer Society Conference on Computer Vision and Pattern Recognition, CVPR'07. Piscataway, NJ: Institute of Electrical and Electronics Engineers (IEEE). 2007. p. 1-6. 4270395 https://doi.org/10.1109/CVPR.2007.383397