Abstract
In this study, the observation of self-organized nanostructure and the electrical characterization of alkanethiol-encapsulated gold particles are carried out using atomic force microscope (AFM). The AFM observation of nanostructure of gold dots was performed in the contact mode. The I-V characteristics between AFM tip and HOPG substrate through hexadecanethiol-encapsulated gold particles was measured using a gold-coated tip.
Original language | English |
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Title of host publication | Digest of Papers |
Subtitle of host publication | Microprocesses and Nanotechnology '99 : 1999 International Microprocesses and Nanotechnology Conference |
Place of Publication | Piscataway, NJ |
Publisher | Institute of Electrical and Electronics Engineers (IEEE) |
Pages | 46-47 |
Number of pages | 2 |
ISBN (Print) | 4930813972 |
DOIs | |
Publication status | Published - 1999 |
Externally published | Yes |
Event | 1999 International Microprocesses and Nanotechnology Conference - Yokohama, Japan Duration: 6 Jul 1999 → 8 Jul 1999 |
Conference
Conference | 1999 International Microprocesses and Nanotechnology Conference |
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Country/Territory | Japan |
City | Yokohama |
Period | 6/07/99 → 8/07/99 |