Abstract
In this study, the observation of self-organized nanostructure and the electrical characterization of alkanethiol-encapsulated gold particles are carried out using atomic force microscope (AFM). The AFM observation of nanostructure of gold dots was performed in the contact mode. The I-V characteristics between AFM tip and HOPG substrate through hexadecanethiol-encapsulated gold particles was measured using a gold-coated tip.
| Original language | English |
|---|---|
| Title of host publication | Digest of Papers |
| Subtitle of host publication | Microprocesses and Nanotechnology '99 : 1999 International Microprocesses and Nanotechnology Conference |
| Place of Publication | Piscataway, NJ |
| Publisher | Institute of Electrical and Electronics Engineers (IEEE) |
| Pages | 46-47 |
| Number of pages | 2 |
| ISBN (Print) | 4930813972 |
| DOIs | |
| Publication status | Published - 1999 |
| Externally published | Yes |
| Event | 1999 International Microprocesses and Nanotechnology Conference - Yokohama, Japan Duration: 6 Jul 1999 → 8 Jul 1999 |
Conference
| Conference | 1999 International Microprocesses and Nanotechnology Conference |
|---|---|
| Country/Territory | Japan |
| City | Yokohama |
| Period | 6/07/99 → 8/07/99 |