Schlieren confocal microscopy for phase-relief imaging

Hao Xie, Dayong Jin, Junjie Yu, Tong Peng, Yichen Ding, Changhe Zhou, Peng Xi*

*Corresponding author for this work

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Abstract

We demonstrate a simple phase-sensitive microscopic technique capable of imaging the phase gradient of a transparent specimen, based on the Schlieren modulation and confocal laser scanning microscopy (CLSM). The incident laser is refracted by the phase gradient of the specimen and excites a fluorescence plate behind the specimen to create a secondary illumination; then the fluoresence is modulated by a partial obstructor before entering the confocal pinhole. The quantitative relationship between the image intensity and the sample phase gradient can be derived. This setup is very easy to be adapted to current confocal setups, so that multimodality fluorescence/structure images can be obtained within a single system.

Original languageEnglish
Pages (from-to)1238-1241
Number of pages4
JournalOptics Letters
Volume39
Issue number5
DOIs
Publication statusPublished - 1 Mar 2014

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Bibliographical note

This paper was published in Optics Letters and is made available as an electronic reprint with the permission of OSA. The paper can be found at the following URL on the OSA website: http://www.opticsinfobase.org/ol/abstract.cfm?uri=ol-39-5-1238. Systematic or multiple reproduction or distribution to multiple locations via electronic or other means is prohibited and is subject to penalties under law.

Cite this

Xie, H., Jin, D., Yu, J., Peng, T., Ding, Y., Zhou, C., & Xi, P. (2014). Schlieren confocal microscopy for phase-relief imaging. Optics Letters, 39(5), 1238-1241. https://doi.org/10.1364/OL.39.001238