Selection diversity with multiple amplify-and-forward relays in Nakagami-m fading channels

Phee Lep Yeoh, Maged Elkashlan, Iain B. Collings

Research output: Chapter in Book/Report/Conference proceedingConference proceeding contribution

3 Citations (Scopus)

Abstract

We present an analytical performance study of selection diversity (SD) with multiple amplify-and-forward relays in independent and identically distributed (i.i.d.) Nakagami-m fading channels. Employing SD is an attractive approach to achieve bandwidth and power efficiencies, by utilizing only a single diversity path with the strongest end-to-end signal-to-noise ratio (SNR) to transmit. For such systems, we derive new closed-form expressions which closely approximate the exact outage probability and symbol error rate (SER), especially at medium to high SNRs. Further insights are drawn from new asymptotic expressions which show that SD achieves a full diversity order in Nakagami-m fading. Interestingly, the diversity order is found to be a product of the number of relays and the minimum per-hop fading parameter in the relay path plus the fading parameter of the direct path.

Original languageEnglish
Title of host publication2010 IEEE 72nd Vehicular Technology Conference Fall, VTC2010-Fall - Proceedings
Place of PublicationPiscataway, NJ
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Pages1-5
Number of pages5
ISBN (Print)9781424435746
DOIs
Publication statusPublished - 2010
Externally publishedYes
Event2010 IEEE 72nd Vehicular Technology Conference Fall, VTC2010-Fall - Ottawa, ON, Canada
Duration: 6 Sep 20109 Sep 2010

Other

Other2010 IEEE 72nd Vehicular Technology Conference Fall, VTC2010-Fall
CountryCanada
CityOttawa, ON
Period6/09/109/09/10

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  • Cite this

    Yeoh, P. L., Elkashlan, M., & Collings, I. B. (2010). Selection diversity with multiple amplify-and-forward relays in Nakagami-m fading channels. In 2010 IEEE 72nd Vehicular Technology Conference Fall, VTC2010-Fall - Proceedings (pp. 1-5). [5594181] Piscataway, NJ: Institute of Electrical and Electronics Engineers (IEEE). https://doi.org/10.1109/VETECF.2010.5594181