Silicon–Germanium: properties, growth and applications

Peter Ashburn*, Darren Bagnall

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingChapterpeer-review

4 Citations (Scopus)

Abstract

Silicon–germanium is an important material that is used for the fabrication of SiGe heterojunction bipolar transistors and strained Si metal–oxide–semiconductor (MOS) transistors for advanced complementary metal—oxide–semiconductor (CMOS) and BiCMOS (bipolar CMOS) technologies. It also has interesting optical properties that are increasingly being applied in silicon-based photonic devices. The key benefit of silicon–germanium is its use in combination with silicon to produce a heterojunction. Strain is incorporated into the silicon–germanium or the silicon during growth, which also gives improved physical properties such as higher values of mobility. This chapter reviews the properties of silicon–germanium, beginning with the electronic properties and then progressing to the optical properties. The growth of silicon–germanium is considered, with particular emphasis on the chemical vapour deposition technique and selective epitaxy. Finally, the properties of polycrystalline silicon–germanium are discussed in the context of its use as a gate material for MOS transistors.

Original languageEnglish
Title of host publicationSpringer handbook of electronic and photonic materials
EditorsSafa Kasap, Peter Capper
Place of PublicationBoston, MA
PublisherSpringer
Chapter22
Pages481-498
Number of pages18
ISBN (Electronic)9780387291857
ISBN (Print)9780387260594
DOIs
Publication statusPublished - 2006
Externally publishedYes

Publication series

NameSpringer Handbooks
ISSN (Print)2522-8692
ISSN (Electronic)2522-8706

Keywords

  • misfit dislocation
  • polycrystalline silicon
  • heterojunction bipolar transistor
  • germanium content
  • quantum well infrared photodetector

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