Abstract
Fluorescence lifetime measurement is an essential process for evaluation and application of optical gain media. An accurate and convenient scheme for fluorescence lifetimemeasurement of complex emission processes with either single or multiple fluorescence lifetimes is essential. We developed a new convolutionbased scheme for fluorescence lifetime measurement. The innovation of the scheme lies in a combination of convolution-based digital signal processing algorithms with a low cost and simple time-domain spectroscopic setup. The convolution-based scheme is able to achieve accurate microsecond fluorescence lifetime resolution using the spectroscopic setup with only millisecond fluorescence lifetime resolution, for both single or multiple fluorescence lifetimes. We demonstrated the performance of the scheme, both theoretically and experimentally, by measuring fluorescence lifetimes associated with complicated emission processes in bismutherbium- doped fibers and erbium-doped fiber.
Original language | English |
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Pages (from-to) | 5033-5043 |
Number of pages | 11 |
Journal | Journal of Lightwave Technology |
Volume | 34 |
Issue number | 21 |
DOIs | |
Publication status | Published - 1 Nov 2016 |
Keywords
- Active fiber
- active fiber characterization
- bismuth erbium doped fiber
- doped fiber amplifier
- fiber laser
- fluorescence lifetime measurement
- optical fiber applications
- optical fiber testing
- ERBIUM-DOPED FIBERS
- LEAST-SQUARES
- DECAY CURVES
- AMPLIFIERS
- DECONVOLUTION
- GAIN
- LUMINESCENCE
- BISMUTH