Abstract
We have investigated the temperature dependent recombination dynamics in two bimodally distributed InAs self assembled quantum dots samples. A rate equations model has been implemented to investigate the thermally activated carrier escape mechanism which changes from exciton-like to uncorrelated electron and hole pairs as the quantum dot size varies. For the smaller dots, we find a hot exciton thermal escape process. We evaluated the thermal transfer process between quantum dots by the quantum dot density and carrier escape properties of both samples.
| Original language | English |
|---|---|
| Article number | 123522 |
| Pages (from-to) | 1-8 |
| Number of pages | 8 |
| Journal | Journal of Applied Physics |
| Volume | 111 |
| Issue number | 12 |
| DOIs | |
| Publication status | Published - 15 Jun 2012 |
| Externally published | Yes |
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